| Carrier density and DC conductivity of ultrathin aluminum films | |
| H. Du; J. Gong; C. Sun; S. W. Lee; L. S. Wen | |
| 2004 | |
| Source Publication | Journal of Materials Science
 |
| ISSN | 0022-2461 |
| Volume | 39Issue:8Pages:2865-2867 |
| description.department | chinese acad sci, inst met res, dept surface engn mat, shenyang 110016, peoples r china. sun moon univ, div mat & chem engn, interface engn lab, asan 336708, chungnam, south korea.;du, h (reprint author), chinese acad sci, inst met res, dept surface engn mat, shenyang 110016, peoples r china, peoples r china;hdu72@hotmail.com |
| Keyword | Resistivity Metal Scattering |
| URL | 查看原文 |
| WOS ID | WOS:000220412400028 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/35349 |
| Collection | 中国科学院金属研究所 |
| Recommended Citation GB/T 7714 | H. Du,J. Gong,C. Sun,et al. Carrier density and DC conductivity of ultrathin aluminum films[J]. Journal of Materials Science,2004,39(8):2865-2867. |
| APA | H. Du,J. Gong,C. Sun,S. W. Lee,&L. S. Wen.(2004).Carrier density and DC conductivity of ultrathin aluminum films.Journal of Materials Science,39(8),2865-2867. |
| MLA | H. Du,et al."Carrier density and DC conductivity of ultrathin aluminum films".Journal of Materials Science 39.8(2004):2865-2867. |
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