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Size effect of nano-copper films on complex optical constant and permittivity in frared region
H. Du; S. W. Lee; J. Gong; C. Sun; L. S. Wen
2004
发表期刊Materials Letters
ISSN0167-577X
卷号58期号:6页码:1117-1120
摘要Nano-copper films were prepared by DC magnetron sputtering. Their reflectivity and transmittivity to electromagnetic wave in infrared region were measured with Fourier Transformation Infrared Spectrometer (FTIR), by which their complex optical constant and permittivity were obtained. The results show that the complex optical constant and pen-nittivity of nano-copper films depend upon the film thickness. This dependence is correlated with microstructure transition during the film growth. (C) 2003 Elsevier B.V. All rights reserved.
部门归属sun moon univ, dept mat sci, asan 336708, chungnam, south korea. acad sinica, inst met res, shenyang 110016, peoples r china.;du, h (reprint author), sun moon univ, dept mat sci, asan 336708, chungnam, south korea;hdu72@hotmail.com
关键词Magnetron Sputtering Nano-copper Film Complex Optical Constant Complex Permittivity Size Effect Thin-films Reflectance Thickness
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WOS记录号WOS:000188288600056
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被引频次:11[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/35350
专题中国科学院金属研究所
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H. Du,S. W. Lee,J. Gong,et al. Size effect of nano-copper films on complex optical constant and permittivity in frared region[J]. Materials Letters,2004,58(6):1117-1120.
APA H. Du,S. W. Lee,J. Gong,C. Sun,&L. S. Wen.(2004).Size effect of nano-copper films on complex optical constant and permittivity in frared region.Materials Letters,58(6),1117-1120.
MLA H. Du,et al."Size effect of nano-copper films on complex optical constant and permittivity in frared region".Materials Letters 58.6(2004):1117-1120.
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