| Stripe characterization in La1.6-xNd0.4SrxCuO4 thin films |
| Y. Liu; J. F. Qu; M. Zhu; S. D. Zhang; S. J. Feng; X. G. Li
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| 2004
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| 发表期刊 | Physical Review B
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| ISSN | 1098-0121
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| 卷号 | 70期号:22 |
| 摘要 | We report on the longitudinal (in-plane resistivity rho(ab)) and the transverse (Hall coefficient R-H) transport measurements of La1.6-xNd0.4SrxCuO4 epitaxial films (x=0.08,0.1,0.12,0.14,0.16) grown by an off-axis magnetron sputtering method. It is found that the resistivity jump corresponding to the structural phase transition from low-temperature orthorhombic (LTO) to low-temperature tetragonal (LTT) phase observed in the bulk crystals disappears in the films. All of the films on LaSrAlO4 (LSAO) substrate show the log(1/T) insulating behavior above T-c. The R-H peak broadening together with the LTT phase suppression suggests that the static charge stripes disappear in the films. From these experimental results, one can regard that the nonuniform localization of charge carriers in La1.6-xNd0.4SrxCuO4 films on LSAO, possibly in the form of dynamic stripes, should be responsible for the deviation of the Hall angle cot theta(H) from T-2 law below the metal-insulator crossover temperature T-MI. |
| 部门归属 | univ sci & technol china, hefei natl lab phys sci microscale, hefei 230026, peoples r china. univ sci & technol china, dept mat sci & engn, hefei 230026, peoples r china. acad sinica, int ctr mat phys, shenyang 110015, peoples r china.;li, xg (reprint author), univ sci & technol china, hefei natl lab phys sci microscale, hefei 230026, peoples r china;lixg@ustc.edu.cn
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| 关键词 | Magnetic Fluctuations
Normal-state
Superconductivity
La2-xsrxcuo4
La2-x-yndysrxcuo4
Transport
Insulator
Absence
Liquid
Phases
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| URL | 查看原文
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| WOS记录号 | WOS:000226111800093
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| 引用统计 |
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| 文献类型 | 期刊论文
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| 条目标识符 | http://ir.imr.ac.cn/handle/321006/35472
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| 专题 | 中国科学院金属研究所
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推荐引用方式
GB/T 7714 |
Y. Liu,J. F. Qu,M. Zhu,et al. Stripe characterization in La1.6-xNd0.4SrxCuO4 thin films[J]. Physical Review B,2004,70(22).
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| APA |
Y. Liu,J. F. Qu,M. Zhu,S. D. Zhang,S. J. Feng,&X. G. Li.(2004).Stripe characterization in La1.6-xNd0.4SrxCuO4 thin films.Physical Review B,70(22).
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| MLA |
Y. Liu,et al."Stripe characterization in La1.6-xNd0.4SrxCuO4 thin films".Physical Review B 70.22(2004).
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