| Fatigue failure mechanisms of single-walled carbon nanotube ropes embedded in epoxy |
| Y. Ren; Y. Q. Fu; K. Liao; F. Li; H. M. Cheng
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| 2004
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| 发表期刊 | Applied Physics Letters
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| ISSN | 0003-6951
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| 卷号 | 84期号:15页码:2811-2813 |
| 摘要 | In this work, fatigue failure mechanisms of single-walled carbon nanotube (SWCNT) bundles embedded in epoxy matrix under repeated tensile load were studied. Observed damage and failure modes include: (1) splitting of SWCNT bundles, (2) kink formation and subsequent failure in SWCNTs, and (3) fracture of SWCNT bundles. Patterns of crack propagation under tension in SWCNTs were studied by molecular mechanics simulations, where defect-free SWCNTs and SWCNTs with two different modes of Stone-Wales defects were studied. It is demonstrated by the results of molecular mechanics simulation that the observed fracture surfaces of SWCNT can be reproduced reasonably well, suggesting possible fatigue failure mechanisms of SWCNT in the composite. (C) 2004 American Institute of Physics. |
| 部门归属 | nanyang technol univ, sch mech & prod engn, singapore 639798, singapore. chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china.;liao, k (reprint author), nanyang technol univ, sch mech & prod engn, singapore 639798, singapore;askliao@ntu.edu.sg
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| 关键词 | Interfacial Characteristics
Polymer Matrix
Load-transfer
Tensile
Load
Composites
Deformation
Fracture
Yarns
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| URL | 查看原文
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| WOS记录号 | WOS:000220728100031
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| 引用统计 |
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| 文献类型 | 期刊论文
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| 条目标识符 | http://ir.imr.ac.cn/handle/321006/35535
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| 专题 | 中国科学院金属研究所
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推荐引用方式
GB/T 7714 |
Y. Ren,Y. Q. Fu,K. Liao,et al. Fatigue failure mechanisms of single-walled carbon nanotube ropes embedded in epoxy[J]. Applied Physics Letters,2004,84(15):2811-2813.
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| APA |
Y. Ren,Y. Q. Fu,K. Liao,F. Li,&H. M. Cheng.(2004).Fatigue failure mechanisms of single-walled carbon nanotube ropes embedded in epoxy.Applied Physics Letters,84(15),2811-2813.
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| MLA |
Y. Ren,et al."Fatigue failure mechanisms of single-walled carbon nanotube ropes embedded in epoxy".Applied Physics Letters 84.15(2004):2811-2813.
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