Temperature dependent x-ray diffraction study on Gd5Sn4 compound

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	Temperature dependent x-ray diffraction study on Gd5Sn4 compound
	H. F. Yang; G. H. Rao; G. Y. Liu; Z. W. Ouyang; W. F. Liu; X. M. Feng; W. G. Chu; J. K. Liang
	2004
发表期刊	Journal of Alloys and Compounds
ISSN	0925-8388
卷号	368 期号:1-2 页码:248-250
摘要	The structure and the magnetic properties of the Gd5Sn4 compound have been investigated by means of X-ray diffraction (XRD) and magnetization measurements. Temperature dependent XRD investigation reveals that there is no structural transition around the temperature at which the first-order magnetic transition occurs in this compound, i.e. the compound retains the Sm5Ge4-type structure from 80 K(T-C), which is different from the Gd-5(Si, Ge)(4) system. Based on the Rietveld refinement of the XRD pattern of Gd5Sn4 compound, we show that the unit cell volume exhibits a dip near the Curie temperature, i.e. a negative coefficient of thermal expansion alpha approximate to -1.5 x 10(-4) K-1 from 82 to 90 K and a positive coefficient alpha approximate to 2.2 x 10(-4) K-1 from 90 to 98 K. The coefficient of thermal expansion from 98 to 298 K is only 2.5 x 10(-5) K-1. (C) 2003 Elsevier B.V. All rights reserved.
部门归属	chinese acad sci, inst phys, beijing 100080, peoples r china. chinese acad sci, ctr condensed matter phys, beijing 100080, peoples r china. acad sinica, int ctr mat phys, shenyang 110015, peoples r china.;yang, hf (reprint author), chinese acad sci, inst phys, pob 603, beijing 100080, peoples r china;yhf326@aphy.iphy.ac.cn
关键词	Crystal Structure Rare Earth Compounds X-ray Diffraction Electrical-resistance Magnetic-field Transition Gd-5(Si2ge2)
URL	查看原文
WOS记录号	WOS:000220633200037
引用统计	被引频次：6[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/35664
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	H. F. Yang,G. H. Rao,G. Y. Liu,et al. Temperature dependent x-ray diffraction study on Gd5Sn4 compound[J]. Journal of Alloys and Compounds,2004,368(1-2):248-250.
APA	H. F. Yang.,G. H. Rao.,G. Y. Liu.,Z. W. Ouyang.,W. F. Liu.,...&J. K. Liang.(2004).Temperature dependent x-ray diffraction study on Gd5Sn4 compound.Journal of Alloys and Compounds,368(1-2),248-250.
MLA	H. F. Yang,et al."Temperature dependent x-ray diffraction study on Gd5Sn4 compound".Journal of Alloys and Compounds 368.1-2(2004):248-250.