Temperature-dependent fatigue behaviors of ferroelectric ABO(3)-type and layered perovskite oxide thin films

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	Temperature-dependent fatigue behaviors of ferroelectric ABO(3)-type and layered perovskite oxide thin films
	G. L. Yuan; J. M. Liu; Y. P. Wang; D. Wu; S. T. Zhang; Q. Y. Shao; Z. G. Liu
	2004
发表期刊	Applied Physics Letters
ISSN	0003-6951
卷号	84 期号:17 页码:3352-3354
摘要	The temperature-dependent dielectric and ferroelectric fatigue behaviors of ABO(3)-type perovskite thin films Pb(Zr0.52Ti0.48)O-3 (PZT) and Pb0.75La0.25TiO3 (PLT) and layered Aurivillius thin films SrBi2Ta2O9 (SBT) and Bi3.25La0.75Ti3O12 (BLT) with Pt electrodes are studied. The improved fatigue resistance of PZT and PLT at a low temperature can be explained by the defect-induced suppression of domain switch/nucleation near the film/electrode interface, which requires a long-range diffusion of defects and charges. It is argued that the fatigue effect of SBT and BLT is attributed to the competition between domain-wall pinning and depinning. The perovskitelike slabs and/or (Bi2O2)(2+) layers act as barriers for long-range diffusion of defects and charges, resulting in localization of the defects and charges. Thus, the fatigued SBT and BLT can be easily rejuvenated by a high electric field over a wide temperature range. (C) 2004 American Institute of Physics.
部门归属	nanjing univ, solid state microstruct lab, nanjing 210093, peoples r china. chinese acad sci, int ctr mat phys, shenyang, peoples r china.;liu, jm (reprint author), nanjing univ, solid state microstruct lab, nanjing 210093, peoples r china;liujm@nju.edu.cn
关键词	Srbi2ta2o9 Deposition Capacitors Thickness Mechanism Interface
URL	查看原文
WOS记录号	WOS:000220958100044
引用统计	被引频次：39[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/35696
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	G. L. Yuan,J. M. Liu,Y. P. Wang,et al. Temperature-dependent fatigue behaviors of ferroelectric ABO(3)-type and layered perovskite oxide thin films[J]. Applied Physics Letters,2004,84(17):3352-3354.
APA	G. L. Yuan.,J. M. Liu.,Y. P. Wang.,D. Wu.,S. T. Zhang.,...&Z. G. Liu.(2004).Temperature-dependent fatigue behaviors of ferroelectric ABO(3)-type and layered perovskite oxide thin films.Applied Physics Letters,84(17),3352-3354.
MLA	G. L. Yuan,et al."Temperature-dependent fatigue behaviors of ferroelectric ABO(3)-type and layered perovskite oxide thin films".Applied Physics Letters 84.17(2004):3352-3354.