Structure and microstructural characteristics in the thin films of La1-xSrxMnO3 (x=0.1, 0.2, 0.3)

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	Structure and microstructural characteristics in the thin films of La1-xSrxMnO3 (x=0.1, 0.2, 0.3)
	Y. L. Zhu; X. L. Ma; M. Zhang; D. X. Li; H. B. Lu; Z. H. Chen; G. Z. Yang
	2004
发表期刊	Materials Letters
ISSN	0167-577X
卷号	58 期号:9 页码:1485-1489
摘要	Structure and microstructures in the thin films of La1-xSrxMnO3 (x = 0.1, 0.2, 0.3), prepared by computer-controlled laser molecular-beam epitaxy on SrTiO3 substrate, have been characterized by transmission electron microscopy (TEM). Electron diffractions and high-resolution imaging reveal that the as-received thin films with thickness of 200 nm are epitaxially grown on the SrTiO3 (001) substrate. The as-prepared La1-xSrxMnO3 compounds are structural variants derived from the perovskite structure. The microstructures in all these films are clarified in terms of the oriented microdomains, which are believed to result from the strain relaxation between hetero-epitaxial systems. The functions between doping volume and their microstructural characteristics have been established on the basis of the electron microscopic studies. (C) 2003 Elsevier B.V. All rights reserved.
部门归属	chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. chinese acad sci, inst phys, lab opt phys, beijing 100080, peoples r china.;ma, xl (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, wenhua rd 72, shenyang 110016, peoples r china;xlma@imr.ac.cn
关键词	La1-xsrxmno3 Transmission Electron Microscopy Electron Diffraction Molecular-beam Epitaxy Transmission Electron-microscopy Magnetoresistance Srtio3 Heterostructures Microdomains System
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WOS记录号	WOS:000189131800019
引用统计	被引频次：7[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/35780
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. L. Zhu,X. L. Ma,M. Zhang,et al. Structure and microstructural characteristics in the thin films of La1-xSrxMnO3 (x=0.1, 0.2, 0.3)[J]. Materials Letters,2004,58(9):1485-1489.
APA	Y. L. Zhu.,X. L. Ma.,M. Zhang.,D. X. Li.,H. B. Lu.,...&G. Z. Yang.(2004).Structure and microstructural characteristics in the thin films of La1-xSrxMnO3 (x=0.1, 0.2, 0.3).Materials Letters,58(9),1485-1489.
MLA	Y. L. Zhu,et al."Structure and microstructural characteristics in the thin films of La1-xSrxMnO3 (x=0.1, 0.2, 0.3)".Materials Letters 58.9(2004):1485-1489.