Superperiodic feature on silicon-sputtered highly oriented pyrolytic graphite

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	Superperiodic feature on silicon-sputtered highly oriented pyrolytic graphite
	G. P. Dai; T. S. Xie; H. M. Cheng; H. Q. Ye
	2003
发表期刊	Journal of Materials Science & Technology
ISSN	1005-0302
卷号	19 期号:3 页码:246-248
摘要	Superperiodic feature was observed by scanning tunneling microscopy (STM) on the surface of highly oriented pyrolytic graphite (HOPG) on which silicon was sputtered. The superlattice was analyzed by the moire pattern hypothesis, and the lattice constant is 7.03 nm. For the superlattice, the observed boundaries between the superlattice and the normal graphite areas were zigzag, which was in good agreement with the result predicted theoretically. In addition, the observed lattice constants varied slightly in the superperiodic feature area. This implies the role of intralayer strain in the formation of the observed superlattice on the graphite surface.
部门归属	chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china.;cheng, hm (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china
关键词	Highly Oriented Graphite Scanning Tunneling Microscopy Superlattice Silicon Scanning-tunneling-microscopy Images
URL	查看原文
WOS记录号	WOS:000183282000015
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/35805
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	G. P. Dai,T. S. Xie,H. M. Cheng,et al. Superperiodic feature on silicon-sputtered highly oriented pyrolytic graphite[J]. Journal of Materials Science & Technology,2003,19(3):246-248.
APA	G. P. Dai,T. S. Xie,H. M. Cheng,&H. Q. Ye.(2003).Superperiodic feature on silicon-sputtered highly oriented pyrolytic graphite.Journal of Materials Science & Technology,19(3),246-248.
MLA	G. P. Dai,et al."Superperiodic feature on silicon-sputtered highly oriented pyrolytic graphite".Journal of Materials Science & Technology 19.3(2003):246-248.