Electrochemical characterization of copper surface modified by n-alkanethiols in chloride-containing solutions

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	Electrochemical characterization of copper surface modified by n-alkanethiols in chloride-containing solutions
	H. Y. Ma; C. Yang; B. S. Yin; G. Y. Li; S. H. Chen; J. L. Luo
	2003
发表期刊	Applied Surface Science
ISSN	0169-4332
卷号	218 期号:1-4 页码:143-153
摘要	The self-assembled monolayers (SAMs) of three n-alkanethiols, 1-octadecanethiol (C18SH), 1-dodecanethiol (C12SH), and 1-hexanethiol (C6SH), were formed on the fresh copper surface pretreated by nitric acid etch. The surface properties of the alkanethiol modified copper electrode in chloride-containing solutions were electrochemically characterized. The polarization measurements have shown that alkanethiol SAMs onto copper were able to protect effectively the underlying copper against corrosion. The cyclic voltammetric results, together with FT-IR measurements, showed that alkanethiol SAMs had quite good anodic inhibition at the lower anodic potentials, but this inhibition action gradually lost because of removal of SAMs from the copper substrate with the increase of anodic potentials. Alkanethiol SAMs were proved to be defective by scanning Kelvin probe (SKP) measurements. Electrochemical noise (EN) experiments have shown that SAMs-covered copper electrode suffered pitting attack in HCl solutions. The formation mechanism of pits was explained in this paper. (C) 2003 Elsevier Science B.V. All rights reserved.
部门归属	shandong univ, dept chem, jinan 250100, peoples r china. univ alberta, dept chem & mat engn, edmonton, ab t6g 2g6, canada. state key lab corros & protect met, shenyang 110015, peoples r china.;ma, hy (reprint author), shandong univ, dept chem, jinan 250100, peoples r china
关键词	Self-assembled Monolayers (Sams) Electron Work Function (Ewf) Defect Electrochemical Noise (En) Pitting Self-assembled Monolayers 2-dimensional Polymer-films Scanning-tunneling-microscopy Hydrochloric-acid Solution Probe Force Microscopy Alkyl Thiol Monolayers Chemical Modification 0.5m Nacl Corrosion Gold
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WOS记录号	WOS:000185491500019
引用统计	被引频次：84[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/35965
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	H. Y. Ma,C. Yang,B. S. Yin,et al. Electrochemical characterization of copper surface modified by n-alkanethiols in chloride-containing solutions[J]. Applied Surface Science,2003,218(1-4):143-153.
APA	H. Y. Ma,C. Yang,B. S. Yin,G. Y. Li,S. H. Chen,&J. L. Luo.(2003).Electrochemical characterization of copper surface modified by n-alkanethiols in chloride-containing solutions.Applied Surface Science,218(1-4),143-153.
MLA	H. Y. Ma,et al."Electrochemical characterization of copper surface modified by n-alkanethiols in chloride-containing solutions".Applied Surface Science 218.1-4(2003):143-153.