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Microstructural evolution of localized shear bands induced during explosion in Ti-6Al-4V alloy
Y. B. Xu; M. A. Meyer
2003
Source PublicationJournal of Materials Science & Technology
ISSN1005-0302
Volume19Issue:5Pages:385-387
AbstractMicrostructures of the localized shear bands generated during explosion with a thick-walled cylinder specimen in Ti-6Al-4V alloy, were characterized by TEM and SEM. The results show that the twinning is a major mode of deformation, and the distortion-free grains in the bands with the size of 10 pm in diameter were proposed to be the re-crystallization during dynamic explosion. The further observations show that the alpha --> alpha(2) phase transformation may occur in the bands, and this kind of transformation could be confirmed by its dark field image and electron diffraction analysis. Analysis shows that there is specified orientation between the alpha and alpha(2) Phases.
description.departmentchinese acad sci, met res inst, shenyang natl lab mat sci, shenyang 110016, peoples r china. univ calif san diego, dept mech & aerosp engn, la jolla, ca 92093 usa.;xu, yb (reprint author), chinese acad sci, met res inst, shenyang natl lab mat sci, shenyang 110016, peoples r china
KeywordShear Localization Ti-alloy Phase-transformation Twinning High-strain-rate Dynamic Recrystallization Plastic-deformation Steel
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WOS IDWOS:000185818700001
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Cited Times:17[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/36097
Collection中国科学院金属研究所
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Y. B. Xu,M. A. Meyer. Microstructural evolution of localized shear bands induced during explosion in Ti-6Al-4V alloy[J]. Journal of Materials Science & Technology,2003,19(5):385-387.
APA Y. B. Xu,&M. A. Meyer.(2003).Microstructural evolution of localized shear bands induced during explosion in Ti-6Al-4V alloy.Journal of Materials Science & Technology,19(5),385-387.
MLA Y. B. Xu,et al."Microstructural evolution of localized shear bands induced during explosion in Ti-6Al-4V alloy".Journal of Materials Science & Technology 19.5(2003):385-387.
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