XPS analysis of the cerium conversion coating on the anodized Al6061/SiCp | |
X. W. Yu; C. W. Yan; C. A. Cao; G. Q. Li | |
2003 | |
Source Publication | Journal of Materials Science & Technology
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ISSN | 1005-0302 |
Volume | 19Issue:2Pages:157-160 |
Abstract | A method of concentration analysis based on X-ray photoelectron spectroscopy (XPS) results was introduced. The concentration of Ce-rich conversion coating on the anodized Al based metal matrix composites Al6061/SiCp was then studied according to this method. The results revealed that the Ce conversion coating on the anodized Al6061/SiCp consisted of Al oxide, Ce oxide and Ce hydroxide. The state of Ce element exhibited the mixture of Ce3+ and Ce4+. Some of CeIII was oxidized to be CeIV in the outer layer coating. |
description.department | max planck inst iron res, dept interface chem & surface technol, d-40237 dusseldorf, germany. chinese acad sci, met res inst, state key lab corros & protect, shenyang 110016, peoples r china. univ sci & technol beijing, dept corros, beijing 100083, peoples r china.;yu, xw (reprint author), max planck inst iron res, dept interface chem & surface technol, max planck str 1, d-40237 dusseldorf, germany |
Keyword | Ce-rich Conversion Coating X-ray Photoelectron Spectroscopy Anodization Al6061/sicp Aluminum-alloy Corrosion Protection Al-alloys |
URL | 查看原文 |
WOS ID | WOS:000183048200019 |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.imr.ac.cn/handle/321006/36142 |
Collection | 中国科学院金属研究所 |
Recommended Citation GB/T 7714 | X. W. Yu,C. W. Yan,C. A. Cao,et al. XPS analysis of the cerium conversion coating on the anodized Al6061/SiCp[J]. Journal of Materials Science & Technology,2003,19(2):157-160. |
APA | X. W. Yu,C. W. Yan,C. A. Cao,&G. Q. Li.(2003).XPS analysis of the cerium conversion coating on the anodized Al6061/SiCp.Journal of Materials Science & Technology,19(2),157-160. |
MLA | X. W. Yu,et al."XPS analysis of the cerium conversion coating on the anodized Al6061/SiCp".Journal of Materials Science & Technology 19.2(2003):157-160. |
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