Effects of Cr and Sn on defects and electron densities in TiAl alloys | |
W. Deng; Y. Y. Huang; D. H. Wu; M. Z. Cao; L. Y. Xiong | |
2002 | |
发表期刊 | Materials Letters
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ISSN | 0167-577X |
卷号 | 56期号:4页码:593-596 |
摘要 | Positron lifetime spectra of Ti50Al50, Ti50Al48Cr2 and Ti50Al48Sn2 alloys have been analyzed. The experimental results show that the electron densities in bulk and grain boundary of binary TiAl alloy are lower than that of Pure Al and Ti metals. The addition of Cr atoms to TiAl results in the increase of the electron density in bulk and grain boundary of the alloy. Cr atom can provide more free electrons than Ti or Al atom to participate in metallic bonds in the alloy. However, the addition of Sn to TiAl alloy has the opposite effect in comparison with Cr addition. It is suggested that replacing the Al (or Ti) atoms in TiAl alloy by using metallic elements with a bulk positron lifetime lower than that of pure Al (or Ti) metal may increase the free electron density and produce a good effect on room temperature ductility and vice versa. (C) 2002 Elsevier Science B.V. All rights reserved. |
部门归属 | guangxi univ, dept phys, nanning 530004, guangxi prov, peoples r china. chinese acad sci, inst met res, shenyang 110016, peoples r china. chinese acad sci, int ctr mat phys, shenyang 110016, peoples r china.;deng, w (reprint author), guangxi univ, dept phys, nanning 530004, guangxi prov, peoples r china |
关键词 | Tial Positron Lifetime Defect Electron Density Intermetallic Compound Ni3al Alloys Base Alloys Positron Deformation Additions Bulk |
URL | 查看原文 |
WOS记录号 | WOS:000178888500039 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.imr.ac.cn/handle/321006/36257 |
专题 | 中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | W. Deng,Y. Y. Huang,D. H. Wu,et al. Effects of Cr and Sn on defects and electron densities in TiAl alloys[J]. Materials Letters,2002,56(4):593-596. |
APA | W. Deng,Y. Y. Huang,D. H. Wu,M. Z. Cao,&L. Y. Xiong.(2002).Effects of Cr and Sn on defects and electron densities in TiAl alloys.Materials Letters,56(4),593-596. |
MLA | W. Deng,et al."Effects of Cr and Sn on defects and electron densities in TiAl alloys".Materials Letters 56.4(2002):593-596. |
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