Characterization of the microstructure in CMR materials by HREM

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	Characterization of the microstructure in CMR materials by HREM
	D. X. Li; M. G. Wang; H. Q. Ye
	2002
发表期刊	Journal of Electron Microscopy
ISSN	0022-0744
卷号	51 页码:S271-S278
摘要	The microstructures of La0.7Ca0.3MnO3 (LCMO) and La1.0Nd0.2Sr1.8Mn2O7 (LNSMO) bulk materials, LCMO thin films prepared by different methods, and LCMO/Gd0.7Ca0.3MnO3 (GCMO) multilayers have been studied by high-resolution electron microscopy. Twins and microdomains in the LCMO bulk materials as well as the intergrowth structure, ( 10 1) crystal shear Structure, and a complex defect structure in LNSMO bulk materials were observed. The displacement of oxygen ion in LCMO films grown on LaAlO3 (LAO) by pulsed laser deposition (PLD) method induces the structure transformation from orthorhombic to monoclinic. The evolution of strain in LCMO films prepared by reactive sputtering (RS) method on both LAO and SrTiO3 substrates was studied as a function of film thickness. The distribution and size of oriented domains observed in LCMO films prepared by RS were different from those prepared by PLD. The inner strains exist in LCMO and GCMO layers, which might result in lower T, and larger resistivity maximum in LCMO/GCMO multilayers.
部门归属	chinese acad sci, met res inst, shenyang natl lab mat sci, shenyang 110015, peoples r china.;li, dx (reprint author), chinese acad sci, met res inst, shenyang natl lab mat sci, wenhua rd, shenyang 110015, peoples r china
关键词	Hrem Cmr Materials Defect Microdomain Strain Interface Pulsed-laser Deposition Thin-films Giant Magnetoresistance Superlattices Multilayers Resistivity Oxide
URL	查看原文
WOS记录号	WOS:000176596500040
引用统计	被引频次：4[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/36310
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	D. X. Li,M. G. Wang,H. Q. Ye. Characterization of the microstructure in CMR materials by HREM[J]. Journal of Electron Microscopy,2002,51:S271-S278.
APA	D. X. Li,M. G. Wang,&H. Q. Ye.(2002).Characterization of the microstructure in CMR materials by HREM.Journal of Electron Microscopy,51,S271-S278.
MLA	D. X. Li,et al."Characterization of the microstructure in CMR materials by HREM".Journal of Electron Microscopy 51(2002):S271-S278.