The VCNR properties of nano-structured ceria thin films

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	The VCNR properties of nano-structured ceria thin films
	Z. L. Liu; H. M. Yue; Y. Wang; K. L. Yao; Q. Liu
	2002
发表期刊	Solid State Communications
ISSN	0038-1098
卷号	124 期号:5-6 页码:171-176
摘要	Nano-structured ceria thin films were prepared by using the sol-gel dip-coating method. The films were heated at various temperatures. A constant voltage source is used to measure current-voltage (I-V) properties. We found voltage-controlled differential negative resistance (VCNR) properties in these ceria thin films. The VCNR properties exhibit two distinct characteristics. One is that the VCNR behavior is very obvious for the negative I-V characteristics and is not symmetric about the voltage. The other is that in the negative I-V characteristics region, the current increases sharply at low voltage until it reaches a maximum, and subsequently the current decreases to a minimum but not zero, and then the current continues to rise linearly with increasing of voltage. The conduction mechanism of the above phenomena is discussed and the influence of operating temperature, dopant concentration and heating temperature on the VCNR properties of ceria thin films is analyzed. (C) 2002 Elsevier Science Ltd. All rights reserved.
部门归属	huazhong univ sci & technol, dept phys, wuhan 430074, peoples r china. huazhong univ sci & technol, state key lab laser technol, wuhan 430074, peoples r china. acad sinica, int ctr mat phys, shenyang 110015, peoples r china.;yue, hm (reprint author), huazhong univ sci & technol, dept phys, wuhan 430074, peoples r china
关键词	Nano-structured Ceria Thin Films Differential Negative Resistance Properties Sol-gel Method Current-voltage Characteristics Electroformed Mim Structures Gel Resistances Devices
URL	查看原文
WOS记录号	WOS:000179280200003
引用统计	被引频次：8[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/36357
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Z. L. Liu,H. M. Yue,Y. Wang,et al. The VCNR properties of nano-structured ceria thin films[J]. Solid State Communications,2002,124(5-6):171-176.
APA	Z. L. Liu,H. M. Yue,Y. Wang,K. L. Yao,&Q. Liu.(2002).The VCNR properties of nano-structured ceria thin films.Solid State Communications,124(5-6),171-176.
MLA	Z. L. Liu,et al."The VCNR properties of nano-structured ceria thin films".Solid State Communications 124.5-6(2002):171-176.