Electron diffraction study on epsilon '' superstructure in the compound layer of ion-nitrided pure iron

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	Electron diffraction study on epsilon '' superstructure in the compound layer of ion-nitrided pure iron
	Z. Q. Liu; D. X. Li; Z. K. Hei; H. Hashimoto
	2002
发表期刊	Scripta Materialia
ISSN	1359-6462
卷号	46 期号:3 页码:179-185
摘要	The epsilon-Fe2-3N nitrides in the compound layer of ion-nitrided pure iron were studied with transmission electron microscopy. A superlattice with lattice parameters (a" = 2aroot3 = 0.9294 nm, c" = c = 0.4382 run) bigger than those of epsilon hexagonal close packed unit (a = 0.2683 nm, c = 0.4382 nm), which was tentatively named as epsilon" superstructure, was investigated by electron diffraction method. A series of its diffraction patterns were recorded and the diffraction intensity was analyzed. (C) 2002 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.
部门归属	okayama univ sci, dept mech engn, res lab, okayama 7000005, japan. chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. dalian maritime univ, inst mat & technol, dalian 116026, peoples r china.;liu, zq (reprint author), okayama univ sci, dept mech engn, res lab, 1-1 ridai cho, okayama 7000005, japan
关键词	Nitrides Ordering Crystal Structure Electron Diffraction Transmission Electron Microscopy Microscopy
URL	查看原文
WOS记录号	WOS:000175508300001
引用统计	被引频次：8[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/36359
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Z. Q. Liu,D. X. Li,Z. K. Hei,et al. Electron diffraction study on epsilon '' superstructure in the compound layer of ion-nitrided pure iron[J]. Scripta Materialia,2002,46(3):179-185.
APA	Z. Q. Liu,D. X. Li,Z. K. Hei,&H. Hashimoto.(2002).Electron diffraction study on epsilon '' superstructure in the compound layer of ion-nitrided pure iron.Scripta Materialia,46(3),179-185.
MLA	Z. Q. Liu,et al."Electron diffraction study on epsilon '' superstructure in the compound layer of ion-nitrided pure iron".Scripta Materialia 46.3(2002):179-185.