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Studies of the zero-field splittings and the local tilting angles (tau)(Mn2+) for Mn2+ in ZnSiP2 and CdSiP2 semiconductors
W. C. Zheng; S. Y. Wu; J. Zi
2002
发表期刊Physica B-Condensed Matter
ISSN0921-4526
卷号315期号:4页码:223-226
摘要By using the observed local tilting angle tau(Mn2+) of anion tetrahedron, the zero-field splitting D for Mn2+ in chalcopyrite semiconductor ZnSiP2 is calculated from a method related to the high-order perturbation formula of D based on the spin-orbit coupling mechanism. The calculated result shows good agreement with the observed value, suggesting that the method is effective. From the method, the local tilting angle tau(Mn2+) only an upper limit \tau(Mn2+)\ <9 was obtained in the experiment) of CdSiP2:Mn2+ is estimated from the observed zero-field splitting D. The result is discussed. (C) 2002 Elsevier Science B.V. All rights reserved.
部门归属sichuan univ, dept mat sci, chengdu 610064, peoples r china. chinese acad sci, int ctr mat phys, shenyang 110015, peoples r china. fudan univ, surface phys lab, natl key lab, shanghai 200433, peoples r china.;zheng, wc (reprint author), sichuan univ, dept mat sci, chengdu 610064, peoples r china
关键词Electron Paramagnetic Resonance Crystal- And ligAnd-field Theory Local Lattice Distortion Mn2++ Znsip2 Cdsip2 Superposition Model S-6-state Ions Crystal Dependence Centers Epr
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WOS记录号WOS:000176088700001
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被引频次:5[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/36583
专题中国科学院金属研究所
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W. C. Zheng,S. Y. Wu,J. Zi. Studies of the zero-field splittings and the local tilting angles (tau)(Mn2+) for Mn2+ in ZnSiP2 and CdSiP2 semiconductors[J]. Physica B-Condensed Matter,2002,315(4):223-226.
APA W. C. Zheng,S. Y. Wu,&J. Zi.(2002).Studies of the zero-field splittings and the local tilting angles (tau)(Mn2+) for Mn2+ in ZnSiP2 and CdSiP2 semiconductors.Physica B-Condensed Matter,315(4),223-226.
MLA W. C. Zheng,et al."Studies of the zero-field splittings and the local tilting angles (tau)(Mn2+) for Mn2+ in ZnSiP2 and CdSiP2 semiconductors".Physica B-Condensed Matter 315.4(2002):223-226.
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