Determination of six new polytypes in parisite-(Ce) by means of high resolution electron microscopy

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	Determination of six new polytypes in parisite-(Ce) by means of high resolution electron microscopy
	D. W. Meng; X. L. Wu; T. Mou; D. X. Li
	2001
发表期刊	Mineralogical Magazine
ISSN	0026-461X
卷号	65 期号:6 页码:797-806
摘要	The ultrastructures of parisite-(Ce) from a rare-earth mineral deposit of Sichuan Province, southwest China, have been observed and investigated by selected area electron diffraction (SAED) and high resolution electron microscopy (HREM). Six new polytypes 4H, 10H, 16H, 18R, 24R and 30R were determined in parisite-(Ce), as were their crystal structure types, subcell (a'c''', a'c ", a'c') and supercell (ac) parameters, reflection conditions, polytype features and probable space groups. The HREM studies revealed the complex polytypism in parisite-(Ce) whereby the six new polytypes, formed by long-period ordered stacking, always coexist with the common polytype parisite-(Ce)-6R by syntaxy and thus constitute the complex microstructural 'syntactic polycrystals', the host of which is the polytype parisite-(Ce)-6R.
部门归属	china univ geosci, test ctr, wuhan 430074, peoples r china. acad sinica, inst met res, atom imaging solids lab, shenyang 110015, peoples r china.;meng, dw (reprint author), china univ geosci, test ctr, wuhan 430074, peoples r china
关键词	Parisite Polytype High-resolution Electron Microscopy
URL	查看原文
WOS记录号	WOS:000172705200010
引用统计	被引频次：15[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/36757
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	D. W. Meng,X. L. Wu,T. Mou,et al. Determination of six new polytypes in parisite-(Ce) by means of high resolution electron microscopy[J]. Mineralogical Magazine,2001,65(6):797-806.
APA	D. W. Meng,X. L. Wu,T. Mou,&D. X. Li.(2001).Determination of six new polytypes in parisite-(Ce) by means of high resolution electron microscopy.Mineralogical Magazine,65(6),797-806.
MLA	D. W. Meng,et al."Determination of six new polytypes in parisite-(Ce) by means of high resolution electron microscopy".Mineralogical Magazine 65.6(2001):797-806.