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Structure evolution in Poiseuille flow of electrorheological fluids
X. P. Zhao; D. J. Gao
2001
Source PublicationJournal of Physics D-Applied Physics
ISSN0022-3727
Volume34Issue:18Pages:2926-2931
AbstractThe equivalent plate conduction model is employed to simulate the structure evolution in Poiseuille flow of electrorheological (ER) fluids subjected to the short-range interaction of multi-particles. It is found that the time taken to form the plug zone is greatly shortened from 18.5 for a dipole model to 7.8 for a conduction model. The velocity peak value of the breathing transition zone increases markedly compared with the simulation results using the dipole model, which is attributed to (1) the strong interaction between contact zone particles and adjacent particles and (2) there is no slip between particles of the contact zone and the electrodes. Moreover, we obtain the three-dimensional evolving graphs of the velocity profile of particles in the ER fluid, and the structure of the particles evolves from a plug zone to a transition zone, finally becoming a wider plug zone.
description.departmentnorthwestern polytech univ, dept appl phys, inst electrorheol technol 141, xian 710072, peoples r china. chinese acad sci, int ctr mat phys, shenyang 110015, peoples r china.;zhao, xp (reprint author), northwestern polytech univ, dept appl phys, inst electrorheol technol 141, xian 710072, peoples r china
KeywordParticles Model Valve Film
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WOS IDWOS:000171674800031
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Cited Times:7[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/36933
Collection中国科学院金属研究所
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X. P. Zhao,D. J. Gao. Structure evolution in Poiseuille flow of electrorheological fluids[J]. Journal of Physics D-Applied Physics,2001,34(18):2926-2931.
APA X. P. Zhao,&D. J. Gao.(2001).Structure evolution in Poiseuille flow of electrorheological fluids.Journal of Physics D-Applied Physics,34(18),2926-2931.
MLA X. P. Zhao,et al."Structure evolution in Poiseuille flow of electrorheological fluids".Journal of Physics D-Applied Physics 34.18(2001):2926-2931.
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