A study of vacancy-like defects in the single-phase NiAl by positron annihilation

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	A study of vacancy-like defects in the single-phase NiAl by positron annihilation; A study of vacancy-like defects in the single-phase NiAl by positron annihilation
	R. S. Chen; J. T. Guo; W. L. Zhou; L. Y. Xiong
	2000 ; 2000
发表期刊	Scripta Materialia ; Scripta Materialia
ISSN	1359-6462 ; 1359-6462
卷号	43 期号:9 页码:789-794
部门归属	chinese acad sci, inst met res, dept superalloys & intermet, shenyang 110015, peoples r china. dalian univ technol, dept mat engn, dalian 116024, peoples r china. chinese acad sci, inst met res, int ctr mat phys, shenyang 110015, peoples r china.;chen, rs (reprint author), chinese acad sci, inst met res, dept superalloys & intermet, shenyang 110015, peoples r china ; chinese acad sci, inst met res, dept superalloys & intermet, shenyang 110015, peoples r china. dalian univ technol, dept mat engn, dalian 116024, peoples r china. chinese acad sci, inst met res, int ctr mat phys, shenyang 110015, peoples r china.;chen, rs (reprint author), chinese acad sci, inst met res, dept superalloys & intermet, shenyang 110015, peoples r china
关键词	Nial Nial Stoichiometry Stoichiometry Positron Annihilation Positron Annihilation Point-defects Point-defects Lifetime Lifetime Ni3al Ni3al
URL	查看原文 ; 查看原文
WOS记录号	WOS:000165064900002 ; WOS:000165064900002
引用统计	被引频次：3[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/36996
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	R. S. Chen,J. T. Guo,W. L. Zhou,et al. A study of vacancy-like defects in the single-phase NiAl by positron annihilation, A study of vacancy-like defects in the single-phase NiAl by positron annihilation[J]. Scripta Materialia, Scripta Materialia,2000, 2000,43, 43(9):789-794, 789-794.
APA	R. S. Chen,J. T. Guo,W. L. Zhou,&L. Y. Xiong.(2000).A study of vacancy-like defects in the single-phase NiAl by positron annihilation.Scripta Materialia,43(9),789-794.
MLA	R. S. Chen,et al."A study of vacancy-like defects in the single-phase NiAl by positron annihilation".Scripta Materialia 43.9(2000):789-794.