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Electroluminescence from semitransparent au film/nanometer SiO2/nanometer Si/nanometer SiO2/n(+)-Si structure under reverse bias
C. L. Heng; Y. K. Sun; S. T. Wang; Y. Chen; Y. P. Qiao; B. R. Zhang; Z. C. Ma; W. H. Zong; G. G. Qin
2000
发表期刊Applied Physics Letters
ISSN0003-6951
卷号77期号:10页码:1416-1418
摘要Nanometer SiO2/nanometer Si/nanometer SiO2 double-barrier (DB) structures, with Si layers having eleven different thicknesses from 2 to 4 nm, were deposited on n(+)-Si substrates using the magnetron sputtering technique. Strong electroluminescence (EL) from semitransparent Au film/DB/n(+)-Si structure was observed under reverse bias in a range of about 5-7 V. It is found that every EL spectrum of the structure can be decomposed into two Gaussian bands with peaks at around 1.85 and 2.25 eV, and their intensities and current swing synchronously with increasing nanometer Si layer thickness; the periodic length of swing is consistent with half of the de Broglie wavelength of the carriers. A comparison was carried out between EL from the Au/DB/n(+)-Si structure under reverse bias and that from the Au/DB/p-Si structure under forward bias reported previously. (C) 2000 American Institute of Physics. [S0003-6951(00)01736-8].
部门归属peking univ, dept phys, beijing 100871, peoples r china. acad sinica, int ctr mat phys, shenyang 110015, peoples r china. hsri, natl key lab asic, shijiazhuang 0500501, peoples r china.;qin, gg (reprint author), peking univ, dept phys, beijing 100871, peoples r china
关键词Porous Silicon Visible Electroluminescence P-si Band
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WOS记录号WOS:000089017200002
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被引频次:10[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/37046
专题中国科学院金属研究所
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C. L. Heng,Y. K. Sun,S. T. Wang,et al. Electroluminescence from semitransparent au film/nanometer SiO2/nanometer Si/nanometer SiO2/n(+)-Si structure under reverse bias[J]. Applied Physics Letters,2000,77(10):1416-1418.
APA C. L. Heng.,Y. K. Sun.,S. T. Wang.,Y. Chen.,Y. P. Qiao.,...&G. G. Qin.(2000).Electroluminescence from semitransparent au film/nanometer SiO2/nanometer Si/nanometer SiO2/n(+)-Si structure under reverse bias.Applied Physics Letters,77(10),1416-1418.
MLA C. L. Heng,et al."Electroluminescence from semitransparent au film/nanometer SiO2/nanometer Si/nanometer SiO2/n(+)-Si structure under reverse bias".Applied Physics Letters 77.10(2000):1416-1418.
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