Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. II. Effect of high-energy electron thinning | |
S. Y. Li; J. Zhu; H. Q. Ye | |
2000 | |
发表期刊 | Journal of Electron Microscopy
![]() |
ISSN | 0022-0744 |
卷号 | 49期号:1页码:173-177 |
摘要 | The feasibility and the limitation of the 'high-energy electron thinning' method for the production of surface-science-grade samples in situ in the electron microscope are studied. Exploiting the electron beam supplied by high-voltage electron gun in electron microscope, this method can be readily realized. An obvious advantage of this method is that we can monitor the sample surface concurrently. However, this sample preparation method depends strongly on the sample material and the local environment within the electron microscope. Factors relating to the electron thinning speed are briefly discussed. |
部门归属 | tsing hua univ, dept mat sci & engn, sch mat sci & engn, electron microscopy lab, beijing 100084, peoples r china. chinese acad sci, inst met res, atom imaging solids lab, shenyang 110015, peoples r china.;zhu, j (reprint author), tsing hua univ, dept mat sci & engn, sch mat sci & engn, electron microscopy lab, beijing 100084, peoples r china |
关键词 | Transmission Electron Microscopy Plan-view Imaging Of Surfaces Sample Preparation Electron-solid Interaction Au(001) Surface Uhv Microscopy Si(111)-7x7 Diffraction Cu(110) Film |
URL | 查看原文 |
WOS记录号 | WOS:000086028100021 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.imr.ac.cn/handle/321006/37092 |
专题 | 中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | S. Y. Li,J. Zhu,H. Q. Ye. Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. II. Effect of high-energy electron thinning[J]. Journal of Electron Microscopy,2000,49(1):173-177. |
APA | S. Y. Li,J. Zhu,&H. Q. Ye.(2000).Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. II. Effect of high-energy electron thinning.Journal of Electron Microscopy,49(1),173-177. |
MLA | S. Y. Li,et al."Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. II. Effect of high-energy electron thinning".Journal of Electron Microscopy 49.1(2000):173-177. |
条目包含的文件 | 条目无相关文件。 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论