High-resolution and analytic electron microscopy investigations on the microstructure of a TiAl (W, Si) alloy

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	High-resolution and analytic electron microscopy investigations on the microstructure of a TiAl (W, Si) alloy
	R. Yu; L. L. He; Z. X. Jin; J. T. Guo; H. Q. Ye; V. Lupinc
	2000
发表期刊	Zeitschrift Fur Metallkunde
ISSN	0044-3093
卷号	91 期号:4 页码:272-274
摘要	The microstructure of a Ti-47Al-2W-0.5Si alloy has been investigated using high-resolution electron microscopy and analytical electron microscopy. From the three main phases, i.e. gamma, alpha(2) and B2, many precipitates: are formed. Ti(5)Si(3) particles formed in the equiaxed grains match well with the gamma matrix. A new orientation relationship has been identified between the Ti(5)Si(3) and gamma phase. Due to the stabilizing effect of W, B2 phase is formed in the alloy, and it contains much more W, more Si and shows a higher Ti to Al ratio in comparison with the equiaxed gamma phase. Moreover, the gamma precipitates formed in the B2 phase contain small amounts of W and Si. In the (gamma + alpha(2)) lamellar structure, Ti(5)Si(3) and B2 particles are formed. The Ti(5)Si(3) particles were formed mainly by the dissolution of the preliminary B2 particles. This is atcributed to the enrichment of Si and the Ti to Al ratio in the B2 phase.
部门归属	acad sinica, inst met res, atom imaging solids lab, shenyang 110015, peoples r china. cnr, tempe, i-20133 milan, italy.;he, ll (reprint author), acad sinica, inst met res, atom imaging solids lab, shenyang 110015, peoples r china
关键词	Creep Deformation Gamma
URL	查看原文
WOS记录号	WOS:000087044100003
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/37232
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	R. Yu,L. L. He,Z. X. Jin,et al. High-resolution and analytic electron microscopy investigations on the microstructure of a TiAl (W, Si) alloy[J]. Zeitschrift Fur Metallkunde,2000,91(4):272-274.
APA	R. Yu,L. L. He,Z. X. Jin,J. T. Guo,H. Q. Ye,&V. Lupinc.(2000).High-resolution and analytic electron microscopy investigations on the microstructure of a TiAl (W, Si) alloy.Zeitschrift Fur Metallkunde,91(4),272-274.
MLA	R. Yu,et al."High-resolution and analytic electron microscopy investigations on the microstructure of a TiAl (W, Si) alloy".Zeitschrift Fur Metallkunde 91.4(2000):272-274.