Characteristics of the stress relaxation in the thinned two-phase multilayer materials

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	Characteristics of the stress relaxation in the thinned two-phase multilayer materials
	C. R. Chen; Y. Liu; S. X. Li
	1999
发表期刊	Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing
ISSN	0921-5093
卷号	265 期号:1-2 页码:146-152
摘要	In the two-phase multilayer bulk material, strong inner stress field may exist if the thermal expansion coefficient of one phase is distinctly different from that of another phase. When a sample is thinned in cross section of the bulk material for studying by transmission electron microscopy (TEM), stress relaxation will occur in the sample. Thus, stress and strain states in the sample are different from that in the bulk material. In this paper, the finite element method was employed to analyze the characteristics about stress relaxation in the sample when the sample was separated from the bulk material. Results show that: larger residual stresses still remain near the interface; the shear stress field is formed at the local interface region near the free surface, and; stresses change drastically near the intersection of interface and free surface. When the ratio of the sample thickness to the layer thickness is small, the stress sigma(zz) (perpendicular to the sample surface) relaxes throughout the sample thickness in the region remote from the interface, and this stress remains only near the interface. When the ratio of the sample thickness to the layer thickness is large, stress relaxation occurs only near the free surface. (C) 1999 Elsevier Science S.A. All rights reserved.
部门归属	chinese acad sci, inst met res, state key lab fatigue & fracture mat, shenyang 110015, peoples r china.;chen, cr (reprint author), chinese acad sci, inst met res, state key lab fatigue & fracture mat, shenyang 110015, peoples r china
关键词	Relaxation Stress Surface Scanning Electron Microscopy Beam Electron-diffraction Elastic Relaxation Microscopy Layers
URL	查看原文
WOS记录号	WOS:000080208600018
引用统计	被引频次：1[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/37312
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	C. R. Chen,Y. Liu,S. X. Li. Characteristics of the stress relaxation in the thinned two-phase multilayer materials[J]. Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing,1999,265(1-2):146-152.
APA	C. R. Chen,Y. Liu,&S. X. Li.(1999).Characteristics of the stress relaxation in the thinned two-phase multilayer materials.Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing,265(1-2),146-152.
MLA	C. R. Chen,et al."Characteristics of the stress relaxation in the thinned two-phase multilayer materials".Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing 265.1-2(1999):146-152.