Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy

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	Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy
	Z. F. Dong; L. M. Peng; R. Luck; K. Lu
	1998
发表期刊	Philosophical Magazine Letters
ISSN	0950-0839
卷号	77 期号:6 页码:345-350
摘要	The thermal stability of a nanocrystalline (NC) Hf11Ni89 alloy was studied using X-ray diffraction, transmission electron microscopy, resistivity measurements and magnetothermal analysis. Microstructure and composition evolution in the grain boundaries and nanograins prior to evident grain growth was detected, and it was shown that this evolution may have a significant influence on the electrical resistivity and magnetic properties of the sample. Our findings demonstrated that the thermal stability of properties of NC materials is not necessarily equivalent to the grain-size stability of the same materials.
部门归属	chinese acad sci, inst phys, beijing lab electron microscopy, beijing 100080, peoples r china. chinese acad sci, ctr condensed matter phys, beijing 100080, peoples r china. chinese acad sci, inst met res, state key lab rsa, shenyang 110015, peoples r china. max planck inst met forsch, d-70174 stuttgart, germany.;dong, zf (reprint author), chinese acad sci, inst phys, beijing lab electron microscopy, pob 2724, beijing 100080, peoples r china
关键词	Grain-growth
URL	查看原文
WOS记录号	WOS:000073888600006
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/37652
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Z. F. Dong,L. M. Peng,R. Luck,et al. Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy[J]. Philosophical Magazine Letters,1998,77(6):345-350.
APA	Z. F. Dong,L. M. Peng,R. Luck,&K. Lu.(1998).Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy.Philosophical Magazine Letters,77(6),345-350.
MLA	Z. F. Dong,et al."Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy".Philosophical Magazine Letters 77.6(1998):345-350.