Fatigue behaviors of a copper tricrystal - Part II - Crystallographic fatigue crack growth in the vicinity of the triple junction | |
W. P. Jia; S. X. Li; Z. G. Wang; G. Y. Li | |
1998 | |
Source Publication | Journal of Materials Science Letters
![]() |
ISSN | 0261-8028 |
Volume | 17Issue:12Pages:1041-1044 |
description.department | acad sinica, inst met res, state key lab fatigue & fracture mat, shenyang 110015, peoples r china.;jia, wp (reprint author), acad sinica, inst met res, state key lab fatigue & fracture mat, shenyang 110015, peoples r china |
URL | 查看原文 |
WOS ID | WOS:000078836600019 |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.imr.ac.cn/handle/321006/37685 |
Collection | 中国科学院金属研究所 |
Recommended Citation GB/T 7714 | W. P. Jia,S. X. Li,Z. G. Wang,et al. Fatigue behaviors of a copper tricrystal - Part II - Crystallographic fatigue crack growth in the vicinity of the triple junction[J]. Journal of Materials Science Letters,1998,17(12):1041-1044. |
APA | W. P. Jia,S. X. Li,Z. G. Wang,&G. Y. Li.(1998).Fatigue behaviors of a copper tricrystal - Part II - Crystallographic fatigue crack growth in the vicinity of the triple junction.Journal of Materials Science Letters,17(12),1041-1044. |
MLA | W. P. Jia,et al."Fatigue behaviors of a copper tricrystal - Part II - Crystallographic fatigue crack growth in the vicinity of the triple junction".Journal of Materials Science Letters 17.12(1998):1041-1044. |
Files in This Item: | There are no files associated with this item. |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment