| Direct evidence for microplastic fracture in single-crystal silicon at ambient temperature | |
| Y. Q. Wu; Y. B. Xu | |
| 1998 | |
| Source Publication | Philosophical Magazine Letters
 |
| ISSN | 0950-0839 |
| Volume | 78Issue:1Pages:41165 |
| Abstract | A high-resolution transmission electron microscopy image of a microcrack in single-crystal silicon induced by Vickers indentation at ambient temperature is presented. Two 60 degrees dislocations can be clearly seen at the crack tip. The surface of the crack shows a step structure. This microplastic crack is compared with an atomically sharp crack. |
| description.department | chinese acad sci, inst met res, state key lab fatigue & fracture mat, shenyang 110015, peoples r china. chinese acad sci, inst met res, atom imaging solids lab, shenyang 110015, peoples r china.;wu, yq (reprint author), chinese acad sci, inst met res, state key lab fatigue & fracture mat, shenyang 110015, peoples r china |
| Keyword | Resolution Electron-microscopy Cracks Dislocations Propagation Carbide |
| URL | 查看原文 |
| WOS ID | WOS:000074568200002 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/37827 |
| Collection | 中国科学院金属研究所 |
| Recommended Citation GB/T 7714 | Y. Q. Wu,Y. B. Xu. Direct evidence for microplastic fracture in single-crystal silicon at ambient temperature[J]. Philosophical Magazine Letters,1998,78(1):41165. |
| APA | Y. Q. Wu,&Y. B. Xu.(1998).Direct evidence for microplastic fracture in single-crystal silicon at ambient temperature.Philosophical Magazine Letters,78(1),41165. |
| MLA | Y. Q. Wu,et al."Direct evidence for microplastic fracture in single-crystal silicon at ambient temperature".Philosophical Magazine Letters 78.1(1998):41165. |
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