| Applications of microdiffraction related to HREM | |
| J. Zhu; X. F. Duan; D. X. Li; H. Q. Ye | |
| 1998 | |
| Source Publication | Microscopy Research and Technique
 |
| ISSN | 1059-910X |
| Volume | 40Issue:2Pages:122-135 |
| Abstract | This paper deals with the coherent and the incoherent microdiffraction, as well as their applications, for example, determination of the nature of defects and boundaries, measurement of the strain field and identification of the symmetry, etc. The localized structure information obtained from microdiffraction has been compared with and complements that provided by HREM. (C) 1998 Wiley-Liss, Inc. |
| description.department | tsing hua univ, sch mat sci & engn, beijing 100084, peoples r china. chinese acad sci, beijing lab electron microscopy, beijing 100080, peoples r china. acad sinica, inst met res, atom imaging solids lab, shenyang 110015, peoples r china.;zhu, j (reprint author), tsing hua univ, sch mat sci & engn, beijing 100084, peoples r china |
| Keyword | Coherence Of Source Domain Boundary Stacking Fault Interference Fringe Strain Field Beam Electron-diffraction Strained-layer Superlattices Antiphase Domain Boundaries Elastic Relaxation Micro-diffraction Crystals Dislocations Distortions Specimens Phase |
| URL | 查看原文 |
| WOS ID | WOS:000071748600004 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/37927 |
| Collection | 中国科学院金属研究所 |
| Recommended Citation GB/T 7714 | J. Zhu,X. F. Duan,D. X. Li,et al. Applications of microdiffraction related to HREM[J]. Microscopy Research and Technique,1998,40(2):122-135. |
| APA | J. Zhu,X. F. Duan,D. X. Li,&H. Q. Ye.(1998).Applications of microdiffraction related to HREM.Microscopy Research and Technique,40(2),122-135. |
| MLA | J. Zhu,et al."Applications of microdiffraction related to HREM".Microscopy Research and Technique 40.2(1998):122-135. |
| Files in This Item: | There are no files associated with this item. | |||||
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment