Combination algorithm for curve fitting of X-ray photoelectron spectroscopy (XPS) data

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	Combination algorithm for curve fitting of X-ray photoelectron spectroscopy (XPS) data
	Y. D. Gong
	1997
发表期刊	Journal of Trace and Microprobe Techniques
ISSN	0733-4680
卷号	15 期号:4 页码:399-404
摘要	In this paper, a convoluted line shape is employed in the fitting procedure of X-ray photoelectron spectroscopy (XPS) data. Choosing an appropriate line shape is very important for curve fitting of XPS data. Generally, people choose the Gauss-Lorentz product function (GLP) or Gauss-Lorentz sum function (GLS) as the line Shape [3,4], but they are not strict because the true line shape is a convolution of Gaussian and Lorentzian. It is found that the convolution line shape can give more exact results for the processing of XPS data. The new algorithm is called "combination algorithm".
部门归属	chinese acad sci, inst met res, shenyang 110015, peoples r china.;gong, yd (reprint author), chinese acad sci, inst met res, 72 wenhua rd, shenyang 110015, peoples r china
关键词	Xps Curve Fitting Combination Algorithm
URL	查看原文
WOS记录号	WOS:000071005400006
引用统计	被引频次：1[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/37961
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. D. Gong. Combination algorithm for curve fitting of X-ray photoelectron spectroscopy (XPS) data[J]. Journal of Trace and Microprobe Techniques,1997,15(4):399-404.
APA	Y. D. Gong.(1997).Combination algorithm for curve fitting of X-ray photoelectron spectroscopy (XPS) data.Journal of Trace and Microprobe Techniques,15(4),399-404.
MLA	Y. D. Gong."Combination algorithm for curve fitting of X-ray photoelectron spectroscopy (XPS) data".Journal of Trace and Microprobe Techniques 15.4(1997):399-404.