| Measurement of grain growth in nanocrystalline materials by means of differential scanning calorimetry | |
| K. Lu; Z. F. Dong | |
| 1997 | |
| Source Publication | Journal of Materials Science & Technology
 |
| ISSN | 1005-0302 |
| Volume | 13Issue:6Pages:491-494 |
| Abstract | In this work, we demonstrated that the differential scanning calorimetry (DSC) is not always reliable in measuring thermal stability and grain growth process in nanocrystalline materials by a quantitative analysis and comparison of the DSC data measured in nanocrystalline Ni-P and Hf-Ni samples. |
| description.department | chinese acad sci, inst met res, state key lab rsa, shenyang 110015, peoples r china.;lu, k (reprint author), chinese acad sci, inst met res, state key lab rsa, shenyang 110015, peoples r china |
| Keyword | Thermal-stability Ni Alloys |
| URL | 查看原文 |
| WOS ID | WOS:000071929300011 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/38039 |
| Collection | 中国科学院金属研究所 |
| Recommended Citation GB/T 7714 | K. Lu,Z. F. Dong. Measurement of grain growth in nanocrystalline materials by means of differential scanning calorimetry[J]. Journal of Materials Science & Technology,1997,13(6):491-494. |
| APA | K. Lu,&Z. F. Dong.(1997).Measurement of grain growth in nanocrystalline materials by means of differential scanning calorimetry.Journal of Materials Science & Technology,13(6),491-494. |
| MLA | K. Lu,et al."Measurement of grain growth in nanocrystalline materials by means of differential scanning calorimetry".Journal of Materials Science & Technology 13.6(1997):491-494. |
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