Measurement of grain growth in nanocrystalline materials by means of differential scanning calorimetry

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	Measurement of grain growth in nanocrystalline materials by means of differential scanning calorimetry
	K. Lu; Z. F. Dong
	1997
发表期刊	Journal of Materials Science & Technology
ISSN	1005-0302
卷号	13 期号:6 页码:491-494
摘要	In this work, we demonstrated that the differential scanning calorimetry (DSC) is not always reliable in measuring thermal stability and grain growth process in nanocrystalline materials by a quantitative analysis and comparison of the DSC data measured in nanocrystalline Ni-P and Hf-Ni samples.
部门归属	chinese acad sci, inst met res, state key lab rsa, shenyang 110015, peoples r china.;lu, k (reprint author), chinese acad sci, inst met res, state key lab rsa, shenyang 110015, peoples r china
关键词	Thermal-stability Ni Alloys
URL	查看原文
WOS记录号	WOS:000071929300011
引用统计	被引频次：4[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/38039
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	K. Lu,Z. F. Dong. Measurement of grain growth in nanocrystalline materials by means of differential scanning calorimetry[J]. Journal of Materials Science & Technology,1997,13(6):491-494.
APA	K. Lu,&Z. F. Dong.(1997).Measurement of grain growth in nanocrystalline materials by means of differential scanning calorimetry.Journal of Materials Science & Technology,13(6),491-494.
MLA	K. Lu,et al."Measurement of grain growth in nanocrystalline materials by means of differential scanning calorimetry".Journal of Materials Science & Technology 13.6(1997):491-494.