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Study on the stress-induced gamma->alpha(2) transformation in a hot-deformed Ti-45Al-10Nb alloy by high-resolution transmission electron microscopy
J. G. Wang; G. L. Chen; L. C. Zhang; H. Q. Ye
1997
发表期刊Materials Letters
ISSN0167-577X
卷号31期号:3-6页码:179-183
摘要A stress-induced gamma --> alpha(2) transformation phenomenon in a hot-deformed Ti-45Al-10Nb alloy was investigated by high-resolution transmission electron microscopy (HREM). This deformation-induced gamma --> alpha(2) phase transformation is an interface related process. The interfacial superdislocations emitted from the deviating semi-coherent alpha(2)/gamma interface react with each other or with the moving dislocations in the gamma-phase resulting in the formation of the stress-induced alpha(2)-phase. Meanwhile, the orientation of the gamma-phase, of which interface the interfacial superdislocation swept, was also changed. The structure of the dislocation ledges plays an important role in the formation of the deformation-induced alpha(2)-phase.
部门归属acad sinica,inst met res,atom imaging solids lab,shenyang 110015,peoples r china.;wang, jg (reprint author), univ sci & technol beijing,state key lab adv met & mat,beijing 100083,peoples r china
关键词Intermetallic Compound Titanium Aluminide Ti-45al-10nb Alloy Stress-induced Phase Transformation Interface Hrem Gamma-titanium Aluminides Intermetallic Alloys Deformation
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文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/38121
专题中国科学院金属研究所
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J. G. Wang,G. L. Chen,L. C. Zhang,et al. Study on the stress-induced gamma->alpha(2) transformation in a hot-deformed Ti-45Al-10Nb alloy by high-resolution transmission electron microscopy[J]. Materials Letters,1997,31(3-6):179-183.
APA J. G. Wang,G. L. Chen,L. C. Zhang,&H. Q. Ye.(1997).Study on the stress-induced gamma->alpha(2) transformation in a hot-deformed Ti-45Al-10Nb alloy by high-resolution transmission electron microscopy.Materials Letters,31(3-6),179-183.
MLA J. G. Wang,et al."Study on the stress-induced gamma->alpha(2) transformation in a hot-deformed Ti-45Al-10Nb alloy by high-resolution transmission electron microscopy".Materials Letters 31.3-6(1997):179-183.
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