The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing

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	The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing
	K. Zhang; I. V. Alexandrov; K. Lu
	1997
Source Publication	Nanostructured Materials
ISSN	0965-9773
Volume	9 Issue:1-8 Pages:347-350
Abstract	The precise X-ray diffraction structural study of a nanocrystalline Cu sample processed by severe plastic deformation was carried out. The obtained results were compared with the data fi om an initial reference Cu sample. By analysis of the centroid position, broadening, shape of Bragg reflections and background integrated intensities from these two samples, such structural features as a lattice parameter, crystallite size, r.m.s. microstrain, dislocation density Debye-Waller parameter and atomic displacements were determined. A conclusion concerning the specific defect structure in the nanocrystallite Cu sample was drawn. (C) 1997 Acta Metallurgica Inc.
description.department	ufa state aviat tech univ,inst phys adv mat,ufa 450000,russia.;zhang, k (reprint author), acad sinica,inst met res,state key lab rsa,shenyang 110015,peoples r china
Keyword	Crystalline
URL	查看原文
Document Type	期刊论文
Identifier	http://ir.imr.ac.cn/handle/321006/38205
Collection	中国科学院金属研究所
Recommended Citation GB/T 7714	K. Zhang,I. V. Alexandrov,K. Lu. The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing[J]. Nanostructured Materials,1997,9(1-8):347-350.
APA	K. Zhang,I. V. Alexandrov,&K. Lu.(1997).The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing.Nanostructured Materials,9(1-8),347-350.
MLA	K. Zhang,et al."The X-ray diffraction study on a nanocrystalline Cu processed by equal-channel angular pressing".Nanostructured Materials 9.1-8(1997):347-350.

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