X-ray studies of crystallite size and structure defects in ultrafine-grained copper

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	X-ray studies of crystallite size and structure defects in ultrafine-grained copper
	I. V. Alexandrov; K. Zhang; K. Lu
	1996
发表期刊	Annales De Chimie-Science Des Materiaux
ISSN	0151-9107
卷号	21 期号:6-7 页码:407-416
摘要	A precise X-ray diffraction analysis of pure Cu with an ultrafine-grained structure produced by a severe plastic-deformation, namely by the method of torsion straining under a pressure of several giga Pascals was performed. The applicability of different X-ray methods for determination of a crystallite size and the internal elastic microdistortions in the investigated Cu sample was revealed.
部门归属	acad sinica,inst met res,state key lab rsa,shenyang 110015,peoples r china.;alexandrov, iv (reprint author), ufa state aviat tech univ,inst phys adv mat,k marksa 12,ufa 450000,russia
关键词	Severe Plastic-deformation Fourier-analysis Diffraction Shapes Pd
URL	查看原文
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/38251
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	I. V. Alexandrov,K. Zhang,K. Lu. X-ray studies of crystallite size and structure defects in ultrafine-grained copper[J]. Annales De Chimie-Science Des Materiaux,1996,21(6-7):407-416.
APA	I. V. Alexandrov,K. Zhang,&K. Lu.(1996).X-ray studies of crystallite size and structure defects in ultrafine-grained copper.Annales De Chimie-Science Des Materiaux,21(6-7),407-416.
MLA	I. V. Alexandrov,et al."X-ray studies of crystallite size and structure defects in ultrafine-grained copper".Annales De Chimie-Science Des Materiaux 21.6-7(1996):407-416.