Quantitative characterization of fracture surface roughness using secondary electron line scanning method

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	Quantitative characterization of fracture surface roughness using secondary electron line scanning method
	X. W. Li; J. F. Tian; Y. Kang; H. H. Su; Z. G. Wang
	1996
发表期刊	Journal of Materials Science Letters
ISSN	0261-8028
卷号	15 期号:24 页码:2137-2140
部门归属	li, xw (reprint author), acad sinica,inst met res,state key lab fatigue & fracture mat,shenyang 110015,peoples r china
关键词	General-method Fractography
URL	查看原文
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/38325
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	X. W. Li,J. F. Tian,Y. Kang,et al. Quantitative characterization of fracture surface roughness using secondary electron line scanning method[J]. Journal of Materials Science Letters,1996,15(24):2137-2140.
APA	X. W. Li,J. F. Tian,Y. Kang,H. H. Su,&Z. G. Wang.(1996).Quantitative characterization of fracture surface roughness using secondary electron line scanning method.Journal of Materials Science Letters,15(24),2137-2140.
MLA	X. W. Li,et al."Quantitative characterization of fracture surface roughness using secondary electron line scanning method".Journal of Materials Science Letters 15.24(1996):2137-2140.