Structural characterization of nanocrystalline copper by means of x-ray diffraction

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	Structural characterization of nanocrystalline copper by means of x-ray diffraction
	K. Zhang; I. V. Alexandrov; R. Z. Valiev; K. Lu
	1996
发表期刊	Journal of Applied Physics
ISSN	0021-8979
卷号	80 期号:10 页码:5617-5624
摘要	Quantitative x-ray-diffraction measurements were performed on a nanocrystalline Cu sample made by severe plastic deformation. The shape of Bragg reflections was found to be represented primarily by a Lorentzian function. A difference of as much as 6%+/-3% was revealed between the integrated intensities from the nanocrystalline and a reference coarse-grained Cu samples. The broadening of Bragg reflections from the nanocrystalline Cu sample was mainly induced by small crystallite sizes and microstrains inside the grains and/or the deformed layers near the grain boundaries. It was found that the grain sizes of nanocrystalline Cu in different crystallographic orientations are essentially the same, while the microstrains exhibit a significant anisotropy. The Debye-Waller parameter B of the nanocrystalline Cu sample was 0.97+/-0.06 Angstrom(2), which suggests that the atomic displacement from their ideal lattice positions equals on average 0.111+/-0.004 Angstrom or 4.3% of the nearest-neighbor spacing. (C) 1996 American Institute of Physics.
部门归属	ufa state aviat tech univ,inst phys adv mat,ufa 450000,russia.;zhang, k (reprint author), acad sinica,inst met res,state key lab rsa,shenyang 110015,peoples r china
关键词	Pd
URL	查看原文
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/38479
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	K. Zhang,I. V. Alexandrov,R. Z. Valiev,et al. Structural characterization of nanocrystalline copper by means of x-ray diffraction[J]. Journal of Applied Physics,1996,80(10):5617-5624.
APA	K. Zhang,I. V. Alexandrov,R. Z. Valiev,&K. Lu.(1996).Structural characterization of nanocrystalline copper by means of x-ray diffraction.Journal of Applied Physics,80(10),5617-5624.
MLA	K. Zhang,et al."Structural characterization of nanocrystalline copper by means of x-ray diffraction".Journal of Applied Physics 80.10(1996):5617-5624.