A program package has been developed under an X-Windows environment for the processing and analysis of high-resolution atomic images. Functions of the software include image segmentation and localization, masked fast Fourier transformation, noise reduction, geometrical analysis, general image manipulation and display of two- or three-dimensional crystal structures. The software can be used in the laboratory of electron microscope for structure and defect analyses of materials.
部门归属
wang, sq (reprint author), acad sinica,inst met res,atom imaging solids lab,72 wenhua rd,shenyang 110015,peoples r china
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