ON THE STRESS-FIELD NEAR THE MICRO-CRACK TIP

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	ON THE STRESS-FIELD NEAR THE MICRO-CRACK TIP
	S. X. Li; Z. G. Wang; S. G. Psakhie
	1993
发表期刊	Physica Status Solidi a-Applied Research
ISSN	0031-8965
卷号	139 期号:1 页码:95-100
摘要	In this paper a molecular dynamic (MD) simulation is conducted to analyze the stress field near a micro-crack tip. The model material for simulation is a single crystal of aluminum. A bulk of 5460 atoms is used to simulate a micro-crack. The interatomic potential of aluminum is calculated by the pseudopotential method of the Krasko-Gurskii model which takes into account the exchange-correlation effects in the dielectric function. From the MD results, a model to describe the stress field of the micro-crack is proposed.
部门归属	russian acad sci,siberian branch,inst strength phys & mat sci,tomsk 634055,russia.;li, sx (reprint author), acad sinica,inst met res,state key lab fatigue & fracture mat,shenyang 110015,peoples r china
关键词	Atomic-structure
URL	查看原文
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/39060
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	S. X. Li,Z. G. Wang,S. G. Psakhie. ON THE STRESS-FIELD NEAR THE MICRO-CRACK TIP[J]. Physica Status Solidi a-Applied Research,1993,139(1):95-100.
APA	S. X. Li,Z. G. Wang,&S. G. Psakhie.(1993).ON THE STRESS-FIELD NEAR THE MICRO-CRACK TIP.Physica Status Solidi a-Applied Research,139(1),95-100.
MLA	S. X. Li,et al."ON THE STRESS-FIELD NEAR THE MICRO-CRACK TIP".Physica Status Solidi a-Applied Research 139.1(1993):95-100.