Medium range order of bulk metallic glasses determined by variable resolution fluctuation electron microscopy | |
J. W. Deng; K. Du; M. L. Sui | |
2012 | |
发表期刊 | Micron
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ISSN | 0968-4328 |
卷号 | 43期号:7页码:827-831 |
摘要 | Variable resolution fluctuation electron microscopy (FEM) experiments are implemented with hollow-cone dark-field transmission electron microscopy. Medium range order lengths of zirconium and iron based bulk metallic glasses and amorphous silicon nitride are determined from the FEM results. It shows that maximum normalized intensity variances of FEM images occur when their nominal resolution approaches the correlation length Lambda of the amorphous materials. Additionally, differences in the length and magnitude of medium range order are compared between metallic and covalent bond amorphous materials. (c) 2012 Elsevier Ltd. All rights reserved. |
部门归属 | [deng, j. w.; du, k.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. [sui, m. l.] beijing univ technol, inst microstruct & property adv mat, beijing 100124, peoples r china.;du, k (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china.;kuidu@imr.ac.cn; mlsui@bjut.edu.cn |
关键词 | Fluctuation Electron Microscopy Medium-range Order Bulk Metallic Glasses Transmission Electron Microscopy Energy-loss Spectroscopy Disordered Materials Amorphous-carbon Structural Order Nanoscale Order Thickness Diffraction Coherence Alloys Probe |
URL | 查看原文 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.imr.ac.cn/handle/321006/59925 |
专题 | 中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | J. W. Deng,K. Du,M. L. Sui. Medium range order of bulk metallic glasses determined by variable resolution fluctuation electron microscopy[J]. Micron,2012,43(7):827-831. |
APA | J. W. Deng,K. Du,&M. L. Sui.(2012).Medium range order of bulk metallic glasses determined by variable resolution fluctuation electron microscopy.Micron,43(7),827-831. |
MLA | J. W. Deng,et al."Medium range order of bulk metallic glasses determined by variable resolution fluctuation electron microscopy".Micron 43.7(2012):827-831. |
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