| Influence of ferromagnetic layer on the exchange coupling of antiferromagnetic NiO-based films |
| S. Guo; W. Liu; X. H. Liu; W. J. Gong; J. N. Feng; Z. D. Zhang
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| 2012
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发表期刊 | Journal of Magnetism and Magnetic Materials
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ISSN | 0304-8853
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卷号 | 324期号:22页码:3933-3936 |
摘要 | Strong effects of ferromagnetic layer (FM-Co, and Ni80Fe20) on the magnitude and blocking temperature of exchange coupling are observed in antiferromagnetic NiO-based films NiO (5nm)/FM1 (t nm)/FM2 (6-t nm). The existence of interfacial spins configuration in glass-like state and FM anisotropy are proposed to interpret a minimum shown in thermal magnetization curves for films with strong exchange coupling effect. The microstructural change of FM layer and the long-range interaction of exchange bias are taken into account to explain a strong dependence of exchange coupling energy density on the thickness t(F) of FM layer when t(F) < 5 nm. (C) 2012 Elsevier B.V. All rights reserved. |
部门归属 | [liu, w.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. chinese acad sci, inst met res, int ctr mat phys, shenyang 110016, peoples r china.;liu, w (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, 72 wenhua rd, shenyang 110016, peoples r china.;wliu@imr.ac.cn
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关键词 | Exchange Bias
Blocking Temperature
Thickness
Interface
Interlayer
Bias
Anisotropy
Enhancement
Dependence
Interfaces
Thickness
Spacer
Model
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URL | 查看原文
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文献类型 | 期刊论文
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条目标识符 | http://ir.imr.ac.cn/handle/321006/59976
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专题 | 中国科学院金属研究所
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推荐引用方式 GB/T 7714 |
S. Guo,W. Liu,X. H. Liu,et al. Influence of ferromagnetic layer on the exchange coupling of antiferromagnetic NiO-based films[J]. Journal of Magnetism and Magnetic Materials,2012,324(22):3933-3936.
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APA |
S. Guo,W. Liu,X. H. Liu,W. J. Gong,J. N. Feng,&Z. D. Zhang.(2012).Influence of ferromagnetic layer on the exchange coupling of antiferromagnetic NiO-based films.Journal of Magnetism and Magnetic Materials,324(22),3933-3936.
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MLA |
S. Guo,et al."Influence of ferromagnetic layer on the exchange coupling of antiferromagnetic NiO-based films".Journal of Magnetism and Magnetic Materials 324.22(2012):3933-3936.
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