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In situ tensile creep behaviors of Sn-4Ag/Cu solder joints revealed by electron backscatter diffraction
Q. K. Zhang; Z. F. Zhang
2012
Source PublicationScripta Materialia
ISSN1359-6462
Volume67Issue:3Pages:289-292
AbstractIn this study, the in situ tensile creep behaviors of Sn-4Ag/Cu solder joints were observed, and microstructural evolutions of the solder during the deformation processes were characterized by electron backscatter diffraction. The results reveal that slow plastic deformation or grain rotation occurs inside different solder grains, depending on their orientations and distance from the joint interface. When the strain increases to a certain extent, dynamic recovery occurs inside some solder grains, resulting in polygonization and grain subdivision. (C) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
description.department[zhang, q. k.; zhang, z. f.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china.;zhang, zf (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china.;zhfzhang@imr.ac.cn
KeywordSn-4ag Solder In Situ Tensile Creep Electron Backscatter Diffraction (Ebsd) Polygonization Grains Subdivision Sn-ag Stress-relaxation Fracture-behavior Thermal Fatigue Deformation Grain Recrystallization Microstructure Orientation Evolution
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Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/60455
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
Q. K. Zhang,Z. F. Zhang. In situ tensile creep behaviors of Sn-4Ag/Cu solder joints revealed by electron backscatter diffraction[J]. Scripta Materialia,2012,67(3):289-292.
APA Q. K. Zhang,&Z. F. Zhang.(2012).In situ tensile creep behaviors of Sn-4Ag/Cu solder joints revealed by electron backscatter diffraction.Scripta Materialia,67(3),289-292.
MLA Q. K. Zhang,et al."In situ tensile creep behaviors of Sn-4Ag/Cu solder joints revealed by electron backscatter diffraction".Scripta Materialia 67.3(2012):289-292.
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