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无衍射单晶硅基板-X射线衍射法快速鉴别安全套表面润滑剂中的滑石粉
赵景红; 郭雅琳; 宋小平; 张宁
2012-10-31
Conference Name2012国际冶金及材料分析测试学术报告会(CCATM2012)
Source Publication2012国际冶金及材料分析测试学术报告会(CCATM2012)论文集
Conference Date2012-10-31
Conference Place北京
Abstract本文采用无衍射单晶硅基板-X射线衍射法快速鉴别安全套表面润滑剂中的微量滑石粉,将安全套表面润滑剂均匀涂于无衍射单晶硅基板表面,在X射线衍射仪上测定.测定条件为:采用功率为2 kw的封闭式Cu靶X光管,管电压为40 kV,电流40 mA,扫描范围为2θ=5~60°,扫描方式为步进扫描,扫描间隔为0.02°,停留时间为1 s.在上述条件下,测定了三个生产厂家的样品,实现了对安全套表面润滑剂中的微量滑石粉的快速鉴别.
description.department辽宁出入境检验检疫局,辽宁大连116001;中国科学院金属研究所,辽宁沈阳110016;
KeywordLatex Condoms Talc Powder Rapid Identification x Ray Diffraction Spectrometry
Funding Organization中国金属学会;中国机械工程学会
Language中文
Document Type会议论文
Identifierhttp://ir.imr.ac.cn/handle/321006/71134
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
赵景红,郭雅琳,宋小平,等. 无衍射单晶硅基板-X射线衍射法快速鉴别安全套表面润滑剂中的滑石粉[C],2012.
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