Nanometer to micrometer scaled inhomogeneous etching of bulk metallic glasses by ion sputtering

IMR OpenIR

	Nanometer to micrometer scaled inhomogeneous etching of bulk metallic glasses by ion sputtering
	J. W. Deng; K. Du; B. Wu; M. L. Sui
	2013
发表期刊	Intermetallics
ISSN	0966-9795
卷号	34 页码:75-82
摘要	In order to faithfully investigate the microscopic and mesoscopic structures of bulk metallic glass (BMG) materials, inhomogeneous contrast in nanometer to micrometer scale in BMG specimens has been throughoutly studied by transmission electron microscopy (TEM), atomic force microscopy (AFM) and scanning electron microscopy (SEM). It is found that ion-milling induced surface roughening and pattern formation are the source of the inhomogeneous contrast in TEM images of BMG samples. Additionally, high resolution TEM and X-ray energy dispersive spectroscopy investigations rule out structure or composition changes in the specimens. The dynamic roughening process during ion-milling as well as saturated pattern sizes are revealed from Zr-, Cu-, Fe- and Mg-based BMGs. The understanding of this inhomogeneous etching in BMG specimens is critical for recently intensive TEM studies on microscopic and mesoscopic inhomogeneities of BMGs. (C) 2012 Elsevier Ltd. All rights reserved.
部门归属	[deng, j. w. ; du, k. ; wu, b.] chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china. [sui, m. l.] beijing univ technol, inst microstruct & property adv mat, beijing 100124, peoples r china. ; du, k (reprint author), chinese acad sci, shenyang natl lab mat sci, inst met res, 72 wenhua rd, shenyang 110016, peoples r china. ; kuidu@imr.ac.cn
关键词	Glasses Metallic Electron Microscopy Transmission Electron Microscopy Scanning Scanning Tunneling Electron Microscopy Medium-range Order Fluctuation Electron-microscopy Mater. Res. 24 Z-l. Zhang Y-m. Chen B-j. Park X-d. Wang Q-p. Cao Tensile Ductility Amorphous-alloys
URL	查看原文
语种	英语
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/71183
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	J. W. Deng,K. Du,B. Wu,et al. Nanometer to micrometer scaled inhomogeneous etching of bulk metallic glasses by ion sputtering[J]. Intermetallics,2013,34:75-82.
APA	J. W. Deng,K. Du,B. Wu,&M. L. Sui.(2013).Nanometer to micrometer scaled inhomogeneous etching of bulk metallic glasses by ion sputtering.Intermetallics,34,75-82.
MLA	J. W. Deng,et al."Nanometer to micrometer scaled inhomogeneous etching of bulk metallic glasses by ion sputtering".Intermetallics 34(2013):75-82.