Correlation between topographic structures and local field emission characteristics of graphene-sheet films | |
J. L. Du; Y. Zhang; S. Z. Deng; N. S. Xu; Z. M. Xiao; J. C. She; Z. S. Wu; H. M. Cheng | |
2013 | |
发表期刊 | Carbon
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ISSN | 0008-6223 |
卷号 | 61页码:507-514 |
摘要 | In an early report, some of us have demonstrated that graphene-sheet films prepared by electrophoretic deposition (EPD) method have great potential as high-performance field emission cathode. We report that the field emission performance from such graphene-sheet films may be enhanced. We have investigated the correlation between topographic structures and local field emission characteristics of graphene-sheet films, prepared with changing EPD deposition time. Detailed experiments show that samples prepared with longer deposition time have better field emission performance. Both scanning electron microscopy and high resolution transmission electron microscopy images show that the topographic structure of the surface layer of the samples deposited with longer time is formed with higher density of graphene sheets with shorter length and fewer graphene layers, in comparison with those with shorter deposition times. Such topographic structure is found experimentally to give large field enhancement. Computer simulation further confirms that a thinner graphene sheet will give more significant geometrical field enhancement at the corner of graphene sheet. Theoretical analysis shows that in an EPD process, longer-length graphene sheets will be deposited before shorter ones, explaining why with longer deposition time, the topographic structure of surface layer consists of shorter-length graphene sheets. (C) 2013 Elsevier Ltd. All rights reserved. |
部门归属 | [du, jiale ; zhang, yu ; deng, shaozhi ; xu, ningsheng ; xiao, zhiming ; she, juncong] sun yat sen univ, sch phys & engn, state key lab optoelect mat & technol, guangdong prov key lab display mat & technol, guangzhou 510275, guangdong, peoples r china. [wu, zhongshuai ; cheng, huiming] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. ; deng, sz (reprint author), sun yat sen univ, sch phys & engn, state key lab optoelect mat & technol, guangdong prov key lab display mat & technol, guangzhou 510275, guangdong, peoples r china. ; stsdsz@mail.sysu.edu.cn |
关键词 | Single-layer Graphene Electron-emission Oxide |
URL | 查看原文 |
语种 | 英语 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.imr.ac.cn/handle/321006/71193 |
专题 | 中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | J. L. Du,Y. Zhang,S. Z. Deng,et al. Correlation between topographic structures and local field emission characteristics of graphene-sheet films[J]. Carbon,2013,61:507-514. |
APA | J. L. Du.,Y. Zhang.,S. Z. Deng.,N. S. Xu.,Z. M. Xiao.,...&H. M. Cheng.(2013).Correlation between topographic structures and local field emission characteristics of graphene-sheet films.Carbon,61,507-514. |
MLA | J. L. Du,et al."Correlation between topographic structures and local field emission characteristics of graphene-sheet films".Carbon 61(2013):507-514. |
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