|Finestructures study of the diamond/titanium interface by transmission electron microscopy|
|X. J. Li; Y. S. Li; L. L. He; Q. Yang; A. Hirose
|Source Publication||Materials Chemistry and Physics
|Abstract||It is well known that a TiC layer can be formed and should act as a buffer layer in diamond films deposited on Ti alloy. Through our cross-sectional investigation in HRTEM, a thin layer (20-30 nm) was first identified between the outermost diamond film and the inner reactive TiC layer adjacent to the substrate. This layer consists of numerous crystalline nanoparticles with grain sizes of 5-20 nm. Through electron nanodiffraction patterns combined with EDS and EELS analysis, these nanoparticles can be identified as a TiC1-xOx phase with a similar structure to cubic TiC. Besides, C atoms and O atoms in TiC1-xOx randomly occupy the vacancies of C in TiC. The thickness of this TiC1-xOx layer does not change significantly with increasing deposition time, and the diamond phase directly nucleates and grows on it. (C) 2013 Elsevier B.V. All rights reserved.|
|description.department||[li, x. j.
; he, l. l.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. [li, y. s.
; hirose, a.] univ saskatchewan, plasma phys lab, saskatoon, sk s7n 5e2, canada. [li, y. s.
; yang, q.] univ saskatchewan, dept mech engn, saskatoon, sk s7n 5a9, canada.
; he, ll (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, 72 wenhua rd, shenyang 110016, peoples r china.
Chemical Vapor Deposition (Cvd)
Electron Microscopy (Tem)
X. J. Li,Y. S. Li,L. L. He,et al. Finestructures study of the diamond/titanium interface by transmission electron microscopy[J]. Materials Chemistry and Physics,2014,143(2):647-652.
X. J. Li,Y. S. Li,L. L. He,Q. Yang,&A. Hirose.(2014).Finestructures study of the diamond/titanium interface by transmission electron microscopy.Materials Chemistry and Physics,143(2),647-652.
X. J. Li,et al."Finestructures study of the diamond/titanium interface by transmission electron microscopy".Materials Chemistry and Physics 143.2(2014):647-652.
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