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The electronic structure characterization of oxide film on bulk nanocrystalline 304 stainless teel in hydrochloric acid solution
S. G. Wang; M. Sun; K. Long; Z. D. Zhang
2013
Source PublicationElectrochimica Acta
ISSN0013-4686
Volume112Pages:371-377
AbstractThe electronic structures and compositions of the two oxide films on bulk nanocrystalline 304 stainless steel (BN-SS304) and its conventional polycrystalline counterpart (CP-SS304) after 30 days' immersion test in 0.5 mol/LHCl solution at room temperature were studied by X-ray photoelectron spectroscopy. The enhanced uniform and pitting corrosion resistances of BN-SS304 were attributed to the larger resistance and better chemical stability of the oxide film on BN-SS304, the less corrosion rate of Cr-0 for BN-SS304 and the larger atomic percentage of Cr3+ in the oxide film on BN-SS304. The larger resistance of oxide film on BN-SS304 resulted from the less state densities of valence electrons around Fermi level in the oxide film on BN-SS304. The better chemical stability of oxide film on BN-SS304 was attributed to (1) the larger binding energies of Fe2+ 2p3/2, Fe3+ 2p3/2 and Cr3+ 2p3/2 in the oxide film on BN-SS304; (2) the larger atomic percentages of Cr3+ and Fe2+ in the oxide film on BN-SS304. (C) 2013 Elsevier Ltd. All rights reserved.
description.department[wang, s. g. ; sun, m. ; zhang, z. d.] chinese acad sci, shenyang natl lab mat sci, shenyang 110016, peoples r china. [wang, s. g. ; sun, m. ; long, k. ; zhang, z. d.] chinese acad sci, inst met res, shenyang 110016, peoples r china. [wang, s. g. ; zhang, z. d.] chinese acad sci, int ctr mat phys, shenyang 110016, peoples r china. ; wang, sg (reprint author), chinese acad sci, shenyang natl lab mat sci, 72 wenhua rd, shenyang 110016, peoples r china. ; sgwang@imr.ac.cn
KeywordStainless Steel Oxide Film Xps Sem Pitting Corrosion Electrochemical Corrosion Behavior Ray Photoelectron-spectroscopy Hot-rolled 304-stainless-steel High-temperature Water Pitting Corrosion Chloride Solution Dissolved-oxygen Passive Films Ingot Iron Xps
URL查看原文
Language英语
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/72425
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
S. G. Wang,M. Sun,K. Long,et al. The electronic structure characterization of oxide film on bulk nanocrystalline 304 stainless teel in hydrochloric acid solution[J]. Electrochimica Acta,2013,112:371-377.
APA S. G. Wang,M. Sun,K. Long,&Z. D. Zhang.(2013).The electronic structure characterization of oxide film on bulk nanocrystalline 304 stainless teel in hydrochloric acid solution.Electrochimica Acta,112,371-377.
MLA S. G. Wang,et al."The electronic structure characterization of oxide film on bulk nanocrystalline 304 stainless teel in hydrochloric acid solution".Electrochimica Acta 112(2013):371-377.
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