Growth of topological crystalline insulator SnTe thin films on Si(111). substrate by molecular beam epitaxy | |
C. H. Yan; H. Guo; J. Wen; Z. D. Zhang; L. L. Wang; K. He; X. C. Ma; S. H. Ji; X. Chen; Q. K. Xue | |
2014 | |
发表期刊 | Surface Science
![]() |
ISSN | 0039-6028 |
卷号 | 621页码:104-108 |
摘要 | We present the growth of atomically flat topological crystalline insulator (TCI) SnTe films on Si(111) substrate by molecular beam epitaxy (MBE). The growth condition for achieving high quality SnTe film was established by a combination of reflection high energy electron diffraction (RI-TEED) and scanning tunneling microscopy (STM) studies. In-situ angle resolved photoemission spectroscopy (ARPES) measurements elucidate the topological nature of the SnTe films. The electronic structure of SnTe films can be tuned by film thickness and Pb doping. The success in growing high quality SnTe thin films with tunable electronic structure is crucial for potential device applications. (C) 2013 Elsevier B.V. All rights reserved. |
部门归属 | [yan, chen-hui ; guo, hua ; wen, jing ; ji, shuai-hua ; chen, xi ; xue, qi-kun] tsinghua univ, dept phys, state key lab low dimens quantum phys, beijing 100084, peoples r china. [yan, chen-hui ; zhang, zhi-dong] chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china. [wang, li-li ; he, ke ; ma, xu-cun] chinese acad sci, inst phys, beijing 100190, peoples r china. ; chen, x (reprint author), tsinghua univ, dept phys, state key lab low dimens quantum phys, beijing 100084, peoples r china. ; xc@mail.tsinghua.edu.cn ; qkxue@mail.tsinghua.edu.cn |
关键词 | Topological Crystalline Insulator Electronic Structure Molecular Beam Epitaxy Scanning Tunneling Microscopy Angle-resolved Photoemission Spectroscopy Experimental Realization Bi2se3 Bi2te3 Phase |
URL | 查看原文 |
语种 | 英语 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.imr.ac.cn/handle/321006/72503 |
专题 | 中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | C. H. Yan,H. Guo,J. Wen,et al. Growth of topological crystalline insulator SnTe thin films on Si(111). substrate by molecular beam epitaxy[J]. Surface Science,2014,621:104-108. |
APA | C. H. Yan.,H. Guo.,J. Wen.,Z. D. Zhang.,L. L. Wang.,...&Q. K. Xue.(2014).Growth of topological crystalline insulator SnTe thin films on Si(111). substrate by molecular beam epitaxy.Surface Science,621,104-108. |
MLA | C. H. Yan,et al."Growth of topological crystalline insulator SnTe thin films on Si(111). substrate by molecular beam epitaxy".Surface Science 621(2014):104-108. |
条目包含的文件 | 条目无相关文件。 |
个性服务 |
推荐该条目 |
保存到收藏夹 |
查看访问统计 |
导出为Endnote文件 |
谷歌学术 |
谷歌学术中相似的文章 |
[C. H. Yan]的文章 |
[H. Guo]的文章 |
[J. Wen]的文章 |
百度学术 |
百度学术中相似的文章 |
[C. H. Yan]的文章 |
[H. Guo]的文章 |
[J. Wen]的文章 |
必应学术 |
必应学术中相似的文章 |
[C. H. Yan]的文章 |
[H. Guo]的文章 |
[J. Wen]的文章 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论