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Enhanced dielectric nonlinearity in epitaxial Pb0.92La0.08Zr0.52Ti0.48O3 thin films
C. R. Ma; B. H. Ma; S. B. Mi; M. Liu; J. Wu
2014
Source PublicationApplied Physics Letters
ISSN0003-6951
Volume104Issue:16
AbstractHigh quality c-axis oriented epitaxial Pb0.92La0.08Zr0.52Ti0.48O3 films were fabricated using pulsed laser deposition on (001) LaAlO3 substrates with conductive LaNiO3 buffers. Besides confirmation of the in-plane and out-of-plane orientations using X-ray diffraction, transmission electron microscopy study has revealed columnar structure across the film thickness with column width around 100 nm. Characterization of ferroelectric properties was carried out in comparison with polycrystalline Pb0.92La0.08Zr0.52Ti0.48O3 films to extract the effect of epitaxial growth. It is found that the ratio between the irreversible Rayleigh parameter and reversible parameter increased up to 0.028 cm/kV at 1 kHz on epitaxial samples, which is more than twice of that on their polycrystalline counterparts. While this ratio decreased to 0.022 cm/kV with increasing frequency to 100 kHz, a much less frequency dependence was observed as compared to the polycrystalline case. The epitaxial Pb0.92La0.08Zr0.52Ti0.48O3 films exhibited a higher mobility of domain wall and the higher extrinsic contribution to the dielectric properties, as well as reduced density of defects, indicating that it is promising for tunable and low power consumption devices. (C) 2014 AIP Publishing LLC.
description.department[ma, chunrui ; wu, judy] univ kansas, dept phys & astron, lawrence, ks 66045 usa. [ma, beihai] argonne natl lab, div energy syst, argonne, il 60439 usa. [mi, shao-bo ; liu, ming] xi an jiao tong univ, minist educ, key lab, elect mat res lab, xian 710049, peoples r china. [mi, shao-bo ; liu, ming] xi an jiao tong univ, int ctr dielect res, xian 710049, peoples r china. [mi, shao-bo] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. ; ma, cr (reprint author), univ kansas, dept phys & astron, lawrence, ks 66045 usa. ; chunrui.ma@gmail.com ; jwu@ku.edu
KeywordPulsed-laser Deposition Ba-cu-o Titanate Films Plzt Films Behavior Ferroelectrics Pb(Zr Ti)O-3
URL查看原文
Language英语
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/72887
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
C. R. Ma,B. H. Ma,S. B. Mi,et al. Enhanced dielectric nonlinearity in epitaxial Pb0.92La0.08Zr0.52Ti0.48O3 thin films[J]. Applied Physics Letters,2014,104(16).
APA C. R. Ma,B. H. Ma,S. B. Mi,M. Liu,&J. Wu.(2014).Enhanced dielectric nonlinearity in epitaxial Pb0.92La0.08Zr0.52Ti0.48O3 thin films.Applied Physics Letters,104(16).
MLA C. R. Ma,et al."Enhanced dielectric nonlinearity in epitaxial Pb0.92La0.08Zr0.52Ti0.48O3 thin films".Applied Physics Letters 104.16(2014).
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