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电感耦合等离子体原子发射光谱法测定高铬镍基合金中微量钴
邹智敏; 郭宏杰; 马洪波; 朱跃进
2014-07-15
Source Publication冶金分析
Issue7Pages:74-77
Abstract采用电感耦合等离子体原子发射光谱(ICP-AES)法对高铬镍基合金690合金中微量钴的测定进行了研究。根据分析线的选择原则,选择背景相对较低、信噪比高的波长为228.616nm谱线作为分析线。采用基体匹配的方法克服基体效应,多谱线拟合(MSF)法校正主量元素铁、铬和镍对分析元素钴的光谱干扰。方法的检出限为0.001μg/mL,校准曲线的线性相关系数为0.999 9。方法用于690合金样品中钴的测定,结果与电感耦合等离子体质谱法相符,加标回收率为100.7%~102.0%,相对标准偏差(n=8)小于2.0%。
description.department中国科学院金属研究所
Keyword电感耦合等离子体原子发射光谱(Icp-aes)法 多谱线拟合(Msf) 高铬镍基合金
Language中文
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/73631
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
邹智敏,郭宏杰,马洪波,等. 电感耦合等离子体原子发射光谱法测定高铬镍基合金中微量钴[J]. 冶金分析,2014(7):74-77.
APA 邹智敏,郭宏杰,马洪波,&朱跃进.(2014).电感耦合等离子体原子发射光谱法测定高铬镍基合金中微量钴.冶金分析(7),74-77.
MLA 邹智敏,et al."电感耦合等离子体原子发射光谱法测定高铬镍基合金中微量钴".冶金分析 .7(2014):74-77.
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