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题名: Structural and Electronic Properties of BaO/MgO(001)-type Interface Studied via Aberration-corrected Transmission Electron Microscopy and First-principles Calculations
作者: L.;  Mi Deng, S. B.;  Chen, D.;  Wang, Y. M.;  Ma, X. L.
发表日期: 2015
刊名: Journal of Materials Science & Technology
相关网址: <Go to ISI>://WOS:000349209100013
Appears in Collections:中国科学院金属研究所_期刊论文

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Recommended Citation:
L.,Mi Deng, S. B.,Chen, D.,et al. Structural And Electronic Properties Of Bao/mgo(001)-type Interface Studied Via Aberration-corrected Transmission Electron Microscopy And First-principles Calculations[J]. Journal Of Materials Science & Technology,2015,31(2):205-209.

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