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Strain-induced modification in microstructure and electrical properties of polycrystalline LaNiO3-delta films
Zhu, M. W.; Wang, H. L.; Lei, H.; Zhang, Y. J.; Jia, N.; Wang, Z. J.; mwzhu@imr.ac.cn
2016
Source PublicationAPPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
ISSN0947-8396
Volume122Issue:4Pages:-
AbstractIn the present work, lanthanum nickel oxide (LaNiO3-delta) thin films are prepared with the sol-gel multilayer coating method. Substrates with different thermal expansion coefficients are chosen to introduce thermal strain into the polycrystalline LaNiO3-delta ( LNO) films. The effects of strain on the microstructure and electrical properties of LNO films are investigated. The results show that with increasing magnitude of strain, except for the change in lattice constant, an increase in defects in LNO films might occur. Furthermore, the resistivity of LNO films firstly decreases as the strain evolves from tensile to compressive, and then, increases again with the increasing compressive strain. The anomalous change in the both resistivity and transport behavior of LNO films under different strains is ascribed to the combined effects of the varying lattice constant and oxygen vacancy density.
description.department[zhu, m. w. ; wang, h. l. ; zhang, y. j. ; wang, z. j.] chinese acad sci, inst met res, shenyang natl lab mat sci, wenhua rd 72, shenyang 110016, peoples r china ; [zhu, m. w.] shenyang aerosp univ, sch mat sci & engn, shenyang 110136, peoples r china ; [lei, h.] chinese acad sci, inst met res, wenhua rd 72, shenyang 110016, peoples r china ; [jia, n.] northeastern univ, key lab anisotropy & texture mat atm, shenyang 110819, peoples r china
Funding OrganizationNational Natural Science of Foundation of China [51202256, 51571057]; Program for New Century Excellent Talents in University [NCET-13-0104]
Indexed Bysci
Language英语
WOS IDWOS:000372259900105
Citation statistics
Cited Times:7[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/75132
Collection中国科学院金属研究所
Corresponding Authormwzhu@imr.ac.cn
Recommended Citation
GB/T 7714
Zhu, M. W.,Wang, H. L.,Lei, H.,et al. Strain-induced modification in microstructure and electrical properties of polycrystalline LaNiO3-delta films[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,2016,122(4):-.
APA Zhu, M. W..,Wang, H. L..,Lei, H..,Zhang, Y. J..,Jia, N..,...&mwzhu@imr.ac.cn.(2016).Strain-induced modification in microstructure and electrical properties of polycrystalline LaNiO3-delta films.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,122(4),-.
MLA Zhu, M. W.,et al."Strain-induced modification in microstructure and electrical properties of polycrystalline LaNiO3-delta films".APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 122.4(2016):-.
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