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Enhanced thermoelectric properties of bismuth telluride films with in-plane and out-of-plane well-ordered microstructures
Jin, Q.; Shi, W. B.; Qiao, J. X.; Sun, C.; Tai, K. P.; Lei, H.; Jiang, X.; Tai, KP; Jiang, X (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China.; Lei, H (reprint author), Chinese Acad Sci, Inst Met Res, Surface Engn Mat Div, Shenyang 110016, Peoples R China.
2016-07-01
发表期刊SCRIPTA MATERIALIA
ISSN1359-6462
卷号119页码:33-37
摘要The n-type Bi2Te3 films with well-ordered microstructures were deposited on SiO2/Si substrates by unbalanced magnetron sputtering (UBMS) technique. Fully compact oriented films were obtained around RT and 400 K. The (001) textured films with both in-plane and out-of-plane ordering were fabricated successfully. The in plane ordering consists of high density of low-angle grain boundaries, which results in notable increase of the electrical conductivity and the improvement in thermoelectric properties from RT to 473 K. The growth mechanism is discussed in terms of the fundamental principles of UBMS comprehensively, demonstrating an efficient approach to tailoring well-ordered Bi2Te3-based alloys with enhanced thermoelectric performance. (C) 2016 Elsevier Ltd. All rights reserved.
部门归属[jin, q. ; qiao, j. x. ; tai, k. p. ; jiang, x.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china ; [shi, w. b. ; sun, c. ; lei, h.] chinese acad sci, inst met res, surface engn mat div, shenyang 110016, peoples r china ; [jiang, x.] univ siegen, inst mat engn, paul bonatz str 9-11, d-57076 siegen, germany
关键词Bi2te3 Films Well-ordered Microstructures Unbalanced Magnetron Sputtering Thermoelectric Properties Low-angle Grain Boundary
学科领域Science & Technology - Other Topics ; Materials Science ; Metallurgy & Metallurgical Engineering
资助者National Natural Science Foundation of China [51402310]; Hundred Talents Program of Chinese Academy of Sciences
收录类别sci
语种英语
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/75817
专题中国科学院金属研究所
通讯作者Tai, KP; Jiang, X (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China.; Lei, H (reprint author), Chinese Acad Sci, Inst Met Res, Surface Engn Mat Div, Shenyang 110016, Peoples R China.
推荐引用方式
GB/T 7714
Jin, Q.,Shi, W. B.,Qiao, J. X.,et al. Enhanced thermoelectric properties of bismuth telluride films with in-plane and out-of-plane well-ordered microstructures[J]. SCRIPTA MATERIALIA,2016,119:33-37.
APA Jin, Q..,Shi, W. B..,Qiao, J. X..,Sun, C..,Tai, K. P..,...&Lei, H .(2016).Enhanced thermoelectric properties of bismuth telluride films with in-plane and out-of-plane well-ordered microstructures.SCRIPTA MATERIALIA,119,33-37.
MLA Jin, Q.,et al."Enhanced thermoelectric properties of bismuth telluride films with in-plane and out-of-plane well-ordered microstructures".SCRIPTA MATERIALIA 119(2016):33-37.
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